Thickness dependence of microstructures and magnetic properties for CoPt/Ag nanocomposite thin films

Ag underlayer (30 nm) has improved the degree of ordering and perpendicular magnetic anisotropy of CoPt films (7.5–10 nm). After annealing at 600 °C and 700 °C, the perpendicular coercivity of CoPt/Ag films has been raised as the thicknesses of CoPt layers are increased. The magnetic easy axis of Co...

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Bibliographic Details
Published in:Thin solid films 2010-10, Vol.518 (24), p.7356-7359
Main Authors: Shen, C.L., Kuo, P.C., Li, Y.S., Lin, G.P., Ou, S.L., Huang, K.T., Chen, S.C.
Format: Article
Language:English
Subjects:
Cobalt base alloys
Cobalt compounds
Condensed matter: structure, mechanical and thermal properties
CoPt/Ag films
Degree of ordering
Exact sciences and technology
Intermetallics
Magnetic easy axis
Magnetic properties
Nanostructure
Orientation
Physics
Platinum compounds
Silver
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Ag underlayer (30 nm) has improved the degree of ordering and perpendicular magnetic anisotropy of CoPt films (7.5–10 nm). After annealing at 600 °C and 700 °C, the perpendicular coercivity of CoPt/Ag films has been raised as the thicknesses of CoPt layers are increased. The magnetic easy axis of CoPt/Ag films would change from a random orientation to an out-of-plane orientation. It is found that Ag underlayer with thickness of 30 nm can improve the perpendicular magnetic properties of CoPt layers with thicknesses in the range of 7.5–10 nm. The CoPt/Ag films would be a candidate for perpendicular magnetic recording media.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2010.04.112