A simple optical spectral calibration technique for pulsed THz sources

We have quantified the sensitivity of a simple method to measure the frequency spectrum of pulsed terahertz (THz) radiation. The THz pulses are upconverted to the optical regime by sideband generation in a zinc telluride (ZnTe) crystal using a continuous wave (cw) narrow-bandwidth near-infrared lase...

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Bibliographic Details
Published in:Optics express 2010-12, Vol.18 (25), p.26517-26524
Main Authors: Wijnen, Frans J P, Berden, Giel, Jongma, Rienk T
Format: Article
Language:English
Subjects:
Calibration
Equipment Design
Equipment Failure Analysis
Lighting - instrumentation
Spectrum Analysis - instrumentation
Tellurium - radiation effects
Terahertz Radiation
Zinc - radiation effects
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Summary:We have quantified the sensitivity of a simple method to measure the frequency spectrum of pulsed terahertz (THz) radiation. The THz pulses are upconverted to the optical regime by sideband generation in a zinc telluride (ZnTe) crystal using a continuous wave (cw) narrow-bandwidth near-infrared laser. A single-shot spectral measurement of sideband pulses with a high resolution spectrometer directly provides the spectral information of the THz pulses without the need of adjustable elements in the detection setup. This method has been applied at the free electron laser FELIX, where, for a wavelength of 150 μm (2 THz), pulse trains of 5 μs duration with an integrated energy of 800 nJ, as well as single pulses with an energy as low as 13 nJ could be characterized on a single-shot basis.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.18.026517