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Microwave Power Limiting Devices Based on the Semiconductor-Metal Transition in Vanadium-Dioxide Thin Films
We present a novel concept of microwave (MW) power-limiting devices based on reversible semiconductor-to-metal transition (SMT) of vanadium-dioxide thin films integrated on coplanar waveguides. We designed, simulated, and fabricated devices, which can be reversibly driven from a low-loss ( 20 dB) as...
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Published in: | IEEE transactions on microwave theory and techniques 2010-09, Vol.58 (9), p.2352-2361 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We present a novel concept of microwave (MW) power-limiting devices based on reversible semiconductor-to-metal transition (SMT) of vanadium-dioxide thin films integrated on coplanar waveguides. We designed, simulated, and fabricated devices, which can be reversibly driven from a low-loss ( 20 dB) as the VO 2 material is changing from semiconductor to the metal state when the incident MW power exceeds a threshold value. These devices are broadband and present a tunable threshold power value. They could be easily integrated as protection circuits from excess power in a large variety of MW components. |
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ISSN: | 0018-9480 1557-9670 |
DOI: | 10.1109/TMTT.2010.2057172 |