Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen

Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance...

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Bibliographic Details
Published in:Optics express 2010-12, Vol.18 (26), p.26769-26774
Main Authors: Di Gennaro, Emiliano, Gallina, Ilaria, Andreone, Antonello, Castaldi, Giuseppe, Galdi, Vincenzo
Format: Article
Language:English
Subjects:
Computer Simulation
Computer-Aided Design
Electromagnetic Fields
Equipment Design
Equipment Failure Analysis
Metals
Models, Theoretical
Refractometry - instrumentation
Scattering, Radiation
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Summary:Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance from the screen. In this paper, we report on the first experimental evidence of such extraordinary transmission phenomena, via microwave (X/Ku-band) measurements on printed-circuit-board prototypes. Experimental results agree very well with full-wave numerical predictions, and indicate an intrinsic robustness of the enhanced transmission phenomena with respect to fabrication tolerances and experimental imperfections.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.18.026769