Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen

Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance...

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Published in:Optics express 2010-12, Vol.18 (26), p.26769-26774
Main Authors: Di Gennaro, Emiliano, Gallina, Ilaria, Andreone, Antonello, Castaldi, Giuseppe, Galdi, Vincenzo
Format: Article
Language:English
Subjects:
Computer Simulation
Computer-Aided Design
Electromagnetic Fields
Equipment Design
Equipment Failure Analysis
Metals
Models, Theoretical
Refractometry - instrumentation
Scattering, Radiation
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cited_by cdi_FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253
cites cdi_FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253
container_end_page 26774
container_issue 26
container_start_page 26769
container_title Optics express
container_volume 18
creator Di Gennaro, Emiliano
Gallina, Ilaria
Andreone, Antonello
Castaldi, Giuseppe
Galdi, Vincenzo
description Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance from the screen. In this paper, we report on the first experimental evidence of such extraordinary transmission phenomena, via microwave (X/Ku-band) measurements on printed-circuit-board prototypes. Experimental results agree very well with full-wave numerical predictions, and indicate an intrinsic robustness of the enhanced transmission phenomena with respect to fabrication tolerances and experimental imperfections.
doi_str_mv 10.1364/OE.18.026769
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_822364489</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>822364489</sourcerecordid><originalsourceid>FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253</originalsourceid><addsrcrecordid>eNpNkU1PwzAMhiMEYmNw44xy40JHkn4kPaKpfEiTdoFzlSbuFtSlI0k3-B_8YDIGiJP9yo9t-TVCl5RMaVpkt4tqSsWUsIIX5REaU1JmSUYEP_6Xj9CZ96-E0IyX_BSNGKVlUebpGH1W7xtwZg02yA7D1miwCnDfYjWEZGccJMbqQYHGYFfS7pPgpPVr473p7Z781ltwHhLoQAVnFG4NdNrjsHL9sFxhPzTJTm5j2S5DlJ0JHhuLZSRiWEPc3sU2rxyAPUcnrew8XPzECXq5r55nj8l88fA0u5snKmUiJCCAclY0UjKZ5YWWgnCViRS0bLkQShPS6LSAnPCyjZqnNJIqI1CokrE8naDrw9yN698G8KGOVynoOmmhH3wtGIsOZ6KM5M2BVK733kFbb6Jp0n3UlNT7N9SLqqaiPrwh4lc_g4dmDfoP_vU9_QIk14ah</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>822364489</pqid></control><display><type>article</type><title>Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen</title><source>EZB Electronic Journals Library</source><creator>Di Gennaro, Emiliano ; Gallina, Ilaria ; Andreone, Antonello ; Castaldi, Giuseppe ; Galdi, Vincenzo</creator><creatorcontrib>Di Gennaro, Emiliano ; Gallina, Ilaria ; Andreone, Antonello ; Castaldi, Giuseppe ; Galdi, Vincenzo</creatorcontrib><description>Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance from the screen. In this paper, we report on the first experimental evidence of such extraordinary transmission phenomena, via microwave (X/Ku-band) measurements on printed-circuit-board prototypes. Experimental results agree very well with full-wave numerical predictions, and indicate an intrinsic robustness of the enhanced transmission phenomena with respect to fabrication tolerances and experimental imperfections.</description><identifier>ISSN: 1094-4087</identifier><identifier>EISSN: 1094-4087</identifier><identifier>DOI: 10.1364/OE.18.026769</identifier><identifier>PMID: 21196953</identifier><language>eng</language><publisher>United States</publisher><subject>Computer Simulation ; Computer-Aided Design ; Electromagnetic Fields ; Equipment Design ; Equipment Failure Analysis ; Metals ; Models, Theoretical ; Refractometry - instrumentation ; Scattering, Radiation</subject><ispartof>Optics express, 2010-12, Vol.18 (26), p.26769-26774</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253</citedby><cites>FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21196953$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Di Gennaro, Emiliano</creatorcontrib><creatorcontrib>Gallina, Ilaria</creatorcontrib><creatorcontrib>Andreone, Antonello</creatorcontrib><creatorcontrib>Castaldi, Giuseppe</creatorcontrib><creatorcontrib>Galdi, Vincenzo</creatorcontrib><title>Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen</title><title>Optics express</title><addtitle>Opt Express</addtitle><description>Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance from the screen. In this paper, we report on the first experimental evidence of such extraordinary transmission phenomena, via microwave (X/Ku-band) measurements on printed-circuit-board prototypes. Experimental results agree very well with full-wave numerical predictions, and indicate an intrinsic robustness of the enhanced transmission phenomena with respect to fabrication tolerances and experimental imperfections.</description><subject>Computer Simulation</subject><subject>Computer-Aided Design</subject><subject>Electromagnetic Fields</subject><subject>Equipment Design</subject><subject>Equipment Failure Analysis</subject><subject>Metals</subject><subject>Models, Theoretical</subject><subject>Refractometry - instrumentation</subject><subject>Scattering, Radiation</subject><issn>1094-4087</issn><issn>1094-4087</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNpNkU1PwzAMhiMEYmNw44xy40JHkn4kPaKpfEiTdoFzlSbuFtSlI0k3-B_8YDIGiJP9yo9t-TVCl5RMaVpkt4tqSsWUsIIX5REaU1JmSUYEP_6Xj9CZ96-E0IyX_BSNGKVlUebpGH1W7xtwZg02yA7D1miwCnDfYjWEZGccJMbqQYHGYFfS7pPgpPVr473p7Z781ltwHhLoQAVnFG4NdNrjsHL9sFxhPzTJTm5j2S5DlJ0JHhuLZSRiWEPc3sU2rxyAPUcnrew8XPzECXq5r55nj8l88fA0u5snKmUiJCCAclY0UjKZ5YWWgnCViRS0bLkQShPS6LSAnPCyjZqnNJIqI1CokrE8naDrw9yN698G8KGOVynoOmmhH3wtGIsOZ6KM5M2BVK733kFbb6Jp0n3UlNT7N9SLqqaiPrwh4lc_g4dmDfoP_vU9_QIk14ah</recordid><startdate>20101220</startdate><enddate>20101220</enddate><creator>Di Gennaro, Emiliano</creator><creator>Gallina, Ilaria</creator><creator>Andreone, Antonello</creator><creator>Castaldi, Giuseppe</creator><creator>Galdi, Vincenzo</creator><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20101220</creationdate><title>Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen</title><author>Di Gennaro, Emiliano ; Gallina, Ilaria ; Andreone, Antonello ; Castaldi, Giuseppe ; Galdi, Vincenzo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Computer Simulation</topic><topic>Computer-Aided Design</topic><topic>Electromagnetic Fields</topic><topic>Equipment Design</topic><topic>Equipment Failure Analysis</topic><topic>Metals</topic><topic>Models, Theoretical</topic><topic>Refractometry - instrumentation</topic><topic>Scattering, Radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Di Gennaro, Emiliano</creatorcontrib><creatorcontrib>Gallina, Ilaria</creatorcontrib><creatorcontrib>Andreone, Antonello</creatorcontrib><creatorcontrib>Castaldi, Giuseppe</creatorcontrib><creatorcontrib>Galdi, Vincenzo</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Optics express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Di Gennaro, Emiliano</au><au>Gallina, Ilaria</au><au>Andreone, Antonello</au><au>Castaldi, Giuseppe</au><au>Galdi, Vincenzo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen</atitle><jtitle>Optics express</jtitle><addtitle>Opt Express</addtitle><date>2010-12-20</date><risdate>2010</risdate><volume>18</volume><issue>26</issue><spage>26769</spage><epage>26774</epage><pages>26769-26774</pages><issn>1094-4087</issn><eissn>1094-4087</eissn><abstract>Recent numerical studies have demonstrated the possibility of achieving substantial enhancements in the transmission of transverse-electric-polarized electromagnetic fields through subwavelength slits in a thin metallic screen by placing single or paired metallic cut-wire arrays at a close distance from the screen. In this paper, we report on the first experimental evidence of such extraordinary transmission phenomena, via microwave (X/Ku-band) measurements on printed-circuit-board prototypes. Experimental results agree very well with full-wave numerical predictions, and indicate an intrinsic robustness of the enhanced transmission phenomena with respect to fabrication tolerances and experimental imperfections.</abstract><cop>United States</cop><pmid>21196953</pmid><doi>10.1364/OE.18.026769</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record>
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subjects Computer Simulation
Computer-Aided Design
Electromagnetic Fields
Equipment Design
Equipment Failure Analysis
Metals
Models, Theoretical
Refractometry - instrumentation
Scattering, Radiation
title Experimental evidence of cut-wire-induced enhanced transmission of transverse-electric fields through sub-wavelength slits in a thin metallic screen
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T19%3A30%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Experimental%20evidence%20of%20cut-wire-induced%20enhanced%20transmission%20of%20transverse-electric%20fields%20through%20sub-wavelength%20slits%20in%20a%20thin%20metallic%20screen&rft.jtitle=Optics%20express&rft.au=Di%20Gennaro,%20Emiliano&rft.date=2010-12-20&rft.volume=18&rft.issue=26&rft.spage=26769&rft.epage=26774&rft.pages=26769-26774&rft.issn=1094-4087&rft.eissn=1094-4087&rft_id=info:doi/10.1364/OE.18.026769&rft_dat=%3Cproquest_cross%3E822364489%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c328t-e8e1726baa2a456da807c483edaf788cd00bd36e5079f88c731a2ac40e6c92253%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=822364489&rft_id=info:pmid/21196953&rfr_iscdi=true