Multipoint alignment monitoring with amorphous silicon position detectors in a complex light path

This document presents an application of the new generation of amorphous silicon position detecting (ASPD) sensors to multipoint alignment. Twelve units are monitored along a 20 m long laser beam, where the light path is deflected by 90° using a pentaprism.

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2010-12, Vol.624 (1), p.73-77
Main Authors: Alberdi, J., Arce, P., Barcala, J.M., Calvo, E., Ferrando, A., Josa, M.I., Molinero, A., Navarrete, J., Oller, J.C., Yuste, C., Calderón, A., Gómez, G., González-Sánchez, F.J., Martínez-Rivero, C., Matorras, F., Rodrigo, T., Ruiz-Árbol, P., Sobrón, M., Vila, I., Virto, A.L.
Format: Article
Language:English
Subjects:
Accelerators
Alignment
Amorphous silicon
Amorphous silicon sensors
Deflection
Detectors
Laser beams
Monitoring
Multipoint alignment
Pentaprisms
Position sensing detectors
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Description
Summary:This document presents an application of the new generation of amorphous silicon position detecting (ASPD) sensors to multipoint alignment. Twelve units are monitored along a 20 m long laser beam, where the light path is deflected by 90° using a pentaprism.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2010.09.008