Identification of A- and B-site cation vacancy defects in perovskite oxide thin films

Cation vacancies on both sublattices (V(Ti), V(Sr)) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed t...

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Bibliographic Details
Published in:Physical review letters 2010-11, Vol.105 (22), p.226102-226102, Article 226102
Main Authors: Keeble, D J, Wicklein, S, Dittmann, R, Ravelli, L, Mackie, R A, Egger, W
Format: Article
Language:English
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Summary:Cation vacancies on both sublattices (V(Ti), V(Sr)) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed that on increasing the fluence above the Ti/Sr∼1 value, the concentration ratio [V(Sr)]/[V(Ti)] systematically increased. Reducing the fluence into the Ti-poor region below resulted in additional vacancy cluster defect formation. Vacancy concentrations greater than ∼50  ppm were observed in all films.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.105.226102