Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)

Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V, and the Moiré patte...

Full description

Saved in:
Bibliographic Details
Published in:Surface science 2010-09, Vol.604 (19), p.1820-1824
Main Authors: Guo, Qinmin, Qin, Zhihui, Liu, Cunding, Zang, Kan, Yu, Yinghui, Cao, Gengyu
Format: Article
Language:English
Subjects:
Bias
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Electric potential
Exact sciences and technology
Fermi surfaces
Image potential states
Moire patterns
Moiré pattern
NaCl layer
Physics
Resonant tunneling
Scanning tunneling microscopy
Voltage
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V, and the Moiré pattern induced by NaCl–Cu lattice mismatch also shows bias dependence. The z–V ( dz/ dV–V) curves and dI/ dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2010.07.013