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Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)
Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V, and the Moiré patte...
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| Published in: | Surface science 2010-09, Vol.604 (19), p.1820-1824 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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| cites | cdi_FETCH-LOGICAL-c362t-2e2d5bf2842c944f85911e750f108fc89604f2858ad0e6cb45e6b9e3c14453293 |
| container_end_page | 1824 |
| container_issue | 19 |
| container_start_page | 1820 |
| container_title | Surface science |
| container_volume | 604 |
| creator | Guo, Qinmin Qin, Zhihui Liu, Cunding Zang, Kan Yu, Yinghui Cao, Gengyu |
| description | Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2
V as well as from 4.0 to 5.0
V, and the Moiré pattern induced by NaCl–Cu lattice mismatch also shows bias dependence. The z–V (
dz/
dV–V) curves and
dI/
dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features. |
| doi_str_mv | 10.1016/j.susc.2010.07.013 |
| format | article |
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V as well as from 4.0 to 5.0
V, and the Moiré pattern induced by NaCl–Cu lattice mismatch also shows bias dependence. The z–V (
dz/
dV–V) curves and
dI/
dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.</description><identifier>ISSN: 0039-6028</identifier><identifier>EISSN: 1879-2758</identifier><identifier>DOI: 10.1016/j.susc.2010.07.013</identifier><identifier>CODEN: SUSCAS</identifier><language>eng</language><publisher>Kidlington: Elsevier B.V</publisher><subject>Bias ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Electric potential ; Exact sciences and technology ; Fermi surfaces ; Image potential states ; Moire patterns ; Moiré pattern ; NaCl layer ; Physics ; Resonant tunneling ; Scanning tunneling microscopy ; Voltage</subject><ispartof>Surface science, 2010-09, Vol.604 (19), p.1820-1824</ispartof><rights>2010</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c362t-2e2d5bf2842c944f85911e750f108fc89604f2858ad0e6cb45e6b9e3c14453293</citedby><cites>FETCH-LOGICAL-c362t-2e2d5bf2842c944f85911e750f108fc89604f2858ad0e6cb45e6b9e3c14453293</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23203000$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Guo, Qinmin</creatorcontrib><creatorcontrib>Qin, Zhihui</creatorcontrib><creatorcontrib>Liu, Cunding</creatorcontrib><creatorcontrib>Zang, Kan</creatorcontrib><creatorcontrib>Yu, Yinghui</creatorcontrib><creatorcontrib>Cao, Gengyu</creatorcontrib><title>Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)</title><title>Surface science</title><description>Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2
V as well as from 4.0 to 5.0
V, and the Moiré pattern induced by NaCl–Cu lattice mismatch also shows bias dependence. The z–V (
dz/
dV–V) curves and
dI/
dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.</description><subject>Bias</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electric potential</subject><subject>Exact sciences and technology</subject><subject>Fermi surfaces</subject><subject>Image potential states</subject><subject>Moire patterns</subject><subject>Moiré pattern</subject><subject>NaCl layer</subject><subject>Physics</subject><subject>Resonant tunneling</subject><subject>Scanning tunneling microscopy</subject><subject>Voltage</subject><issn>0039-6028</issn><issn>1879-2758</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOwzAQRS0EEuXxA6y8QcAi7fiRxJbYQMVL4rGBteU6E-GSOsFOkfgkvoMfI1ERS2Yz0sy9dzSHkCMGUwasmC2naZ3clMMwgHIKTGyRCVOlzniZq20yARA6K4CrXbKX0hKGkjqfkMdLbxOtsMNQYXBI25rarrMRQ08b-4mR9q_evQVMidpQ0YfWx-8v2tm-xxhoG-ijnTez-foUgJ0dkJ3aNgkPf_s-ebm-ep7fZvdPN3fzi_vMiYL3GUde5YuaK8mdlrJWuWYMyxxqBqp2Shcgh22ubAVYuIXMsVhoFI5JmQuuxT452eR2sX1fY-rNyieHTWMDtutklNSyFAxGJd8oXWxTilibLvqVjZ-GgRnZmaUZ2ZmRnYHSDOwG0_FvvE3ONnW0wfn05-SCgxgIDrrzjQ6HXz88RpOcHzFWPqLrTdX6_878ANgag0I</recordid><startdate>20100901</startdate><enddate>20100901</enddate><creator>Guo, Qinmin</creator><creator>Qin, Zhihui</creator><creator>Liu, Cunding</creator><creator>Zang, Kan</creator><creator>Yu, Yinghui</creator><creator>Cao, Gengyu</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20100901</creationdate><title>Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)</title><author>Guo, Qinmin ; Qin, Zhihui ; Liu, Cunding ; Zang, Kan ; Yu, Yinghui ; Cao, Gengyu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c362t-2e2d5bf2842c944f85911e750f108fc89604f2858ad0e6cb45e6b9e3c14453293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Bias</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electric potential</topic><topic>Exact sciences and technology</topic><topic>Fermi surfaces</topic><topic>Image potential states</topic><topic>Moire patterns</topic><topic>Moiré pattern</topic><topic>NaCl layer</topic><topic>Physics</topic><topic>Resonant tunneling</topic><topic>Scanning tunneling microscopy</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Guo, Qinmin</creatorcontrib><creatorcontrib>Qin, Zhihui</creatorcontrib><creatorcontrib>Liu, Cunding</creatorcontrib><creatorcontrib>Zang, Kan</creatorcontrib><creatorcontrib>Yu, Yinghui</creatorcontrib><creatorcontrib>Cao, Gengyu</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Guo, Qinmin</au><au>Qin, Zhihui</au><au>Liu, Cunding</au><au>Zang, Kan</au><au>Yu, Yinghui</au><au>Cao, Gengyu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)</atitle><jtitle>Surface science</jtitle><date>2010-09-01</date><risdate>2010</risdate><volume>604</volume><issue>19</issue><spage>1820</spage><epage>1824</epage><pages>1820-1824</pages><issn>0039-6028</issn><eissn>1879-2758</eissn><coden>SUSCAS</coden><abstract>Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2
V as well as from 4.0 to 5.0
V, and the Moiré pattern induced by NaCl–Cu lattice mismatch also shows bias dependence. The z–V (
dz/
dV–V) curves and
dI/
dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features.</abstract><cop>Kidlington</cop><pub>Elsevier B.V</pub><doi>10.1016/j.susc.2010.07.013</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 0039-6028 |
| ispartof | Surface science, 2010-09, Vol.604 (19), p.1820-1824 |
| issn | 0039-6028 1879-2758 |
| language | eng |
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| source | Elsevier:Jisc Collections:Elsevier Read and Publish Agreement 2022-2024:Freedom Collection (Reading list) |
| subjects | Bias Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Electric potential Exact sciences and technology Fermi surfaces Image potential states Moire patterns Moiré pattern NaCl layer Physics Resonant tunneling Scanning tunneling microscopy Voltage |
| title | Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001) |
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