Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy

We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mount...

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Bibliographic Details
Published in:Review of scientific instruments 2011-02, Vol.82 (2), p.026106-026106-3
Main Authors: Wutscher, T., Giessibl, F. J.
Format: Article
Language:English
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Summary:We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented single-crystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) were taken with these NiO tips.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3549628