Spectral dependence of the refractive index of single-crystalline GaAs for optical applications

The refractive index of crystalline GaAs is measured by the method of interference refractometry in the wavenumber range from 10 500 to 540 cm-1 (or the wavelength range from 0.9 to 18.6 mu m) with a resolution of 0.1 cm-1. The measurement results are approximated by the generalized Cauchy dispersio...

Full description

Saved in:
Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2010-03, Vol.43 (10), p.105402-105402
Main Authors: Plotnichenko, V G, Nazaryants, V O, Kryukova, E B, Dianov, E M
Format: Article
Language:English
Subjects:
Derivatives
Dispersions
Gallium arsenide
Gallium arsenides
Refractive index
Refractivity
Spectra
Wavelengths
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The refractive index of crystalline GaAs is measured by the method of interference refractometry in the wavenumber range from 10 500 to 540 cm-1 (or the wavelength range from 0.9 to 18.6 mu m) with a resolution of 0.1 cm-1. The measurement results are approximated by the generalized Cauchy dispersion formula of the 8th power. Spectral wavelength dependences of the first- and second-order derivatives of the refractive index are calculated, and the zero material dispersion wavelength is found to be Delta *l0 = 6.61 mu m. Using three GaAs plates of different thicknesses we managed to raise the refractive index measurement accuracy up to 4 X 10-4 or 0.02%, being nearly by an order of magnitude better than the data available.
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/43/10/105402