High-precision metrology of highly charged ions via relativistic resonance fluorescence

Resonance fluorescence of laser-driven highly charged ions is investigated with regard to precisely measuring atomic properties. For this purpose an ab initio approach based on the Dirac equation is employed that allows for studying relativistic ions. These systems provide a sensitive means to test...

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Bibliographic Details
Published in:Physical review letters 2011-01, Vol.106 (3), p.033001-033001, Article 033001
Main Authors: Postavaru, O, Harman, Z, Keitel, C H
Format: Article
Language:English
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Summary:Resonance fluorescence of laser-driven highly charged ions is investigated with regard to precisely measuring atomic properties. For this purpose an ab initio approach based on the Dirac equation is employed that allows for studying relativistic ions. These systems provide a sensitive means to test correlated relativistic dynamics, quantum electrodynamic phenomena and nuclear effects by applying x-ray lasers. We show how the narrowing of sidebands in the x-ray fluorescence spectrum by interference due to an additional optical driving can be exploited to determine atomic dipole or multipole moments to unprecedented accuracy.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.106.033001