High-Performance PMN-PT Thick Films

This article describes some of our work on ₀.₆₅Pb(Mg₁/₃Nb(₂/₃)O₃-₀.₃₅PbTiO₃ (0.65PMN-0.35PT) thick films printed on alumina substrates. These thick films, with the nominal composition ₀.₆₅Pb(Mg₁/₃Nb(₂/₃)O₃-₀.₃₅PbTiO₃, were produced by screen-printing and firing a paste prepared from an organic vehic...

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Bibliographic Details
Published in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2010-10, Vol.57 (10), p.2205-2212
Main Authors: KOSEC, Marija, URSIC, Hana, HOLC, Janez, HROVAT, Marko, KUSCER, Danjela, MALIC, Barbara
Format: Article
Language:English
Subjects:
Actuators
Adhesion
Aluminum oxide
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Constants
Cross-disciplinary physics: materials science
rheology
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Displacement
Electrodes
Exact sciences and technology
Firing
Materials science
Materials synthesis
materials processing
Microscopes
Physics
Piezoelectric and electrostrictive constants
Piezoelectricity and electromechanical effects
Scanning electron microscopy
Thick films
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Summary:This article describes some of our work on ₀.₆₅Pb(Mg₁/₃Nb(₂/₃)O₃-₀.₃₅PbTiO₃ (0.65PMN-0.35PT) thick films printed on alumina substrates. These thick films, with the nominal composition ₀.₆₅Pb(Mg₁/₃Nb(₂/₃)O₃-₀.₃₅PbTiO₃, were produced by screen-printing and firing a paste prepared from an organic vehicle and pre-reacted fine particles of avery chemically homogeneous powder. To improve the adhesion of the 0.65PMN-0.35PT to the platinized alumina substrate,a Pb(Zr₀.₅₃Ti₀.₄₇)O₃ layer was deposited between the electrode and the substrate. The samples were then sintered at 950 °C for 2 h with various amounts of packing powder on the alumina (Al₂O₃) substrates. The sintering procedure was optimized to obtain dense 0.65PMN-0.35PT films. The films were then characterized using scanning electron microscopy as well as measurements of the dielectric and piezoelectric constants.The electrostrictive behavior of the 0.65PMN-0.35PT thick films was investigated using an atomic force microscope(AFM). Finally, substrate-free, large-displacement bending type actuators were prepared and characterized, and the normalized displacement (i.e., the displacement per unit length) of the actuators was determined to be 55 μm/cm at 3.6 kV/cm.
ISSN:0885-3010
1525-8955
DOI:10.1109/TUFFC.2010.1679