An Integral approach to measurement of surface roughness parameters from light scattering in dielectric waveguides

An integral approach to measurement of the mean square deviation of a rough surface from light scattering in planar dielectric waveguides is proposed. A relationship between the attenuation coefficient of waveguide modes, waveguide parameters, and surface roughness is established. The limiting sensi...

Full description

Saved in:
Bibliographic Details
Published in:Journal of communications technology & electronics 2011, Vol.56 (1), p.35-38
Main Author: Osovitskii, A. N.
Format: Article
Language:English
Subjects:
Communications Engineering
Constraining
Deviation
Dielectric waveguides
Electrodynamics and Wave Propagation
Electronics
Engineering
Fiber optic measurement
Integrals
Light
Light scattering
Measurement
Methods
Networks
Nuclear radiation
Optics
Propagation
Radiation
Scattering
Studies
Surface roughness
Waveform analysis
Waveguides
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:An integral approach to measurement of the mean square deviation of a rough surface from light scattering in planar dielectric waveguides is proposed. A relationship between the attenuation coefficient of waveguide modes, waveguide parameters, and surface roughness is established. The limiting sensitivity of the method is estimated, and the simplicity of the method implementation and the high sensitivity of measurements are experimentally demonstrated.
ISSN:1064-2269
1555-6557
DOI:10.1134/S1064226911010086