High-Speed in situ Surface X-ray Diffraction Studies of the Electrochemical Dissolution of Au(001)

We present in situ X-ray surface diffraction studies of interface processes with data acquisition rates in the millisecond regime, using the electrochemical dissolution of Au(001) in Cl-containing solution as an example. This progress in time resolution permits monitoring of atomic-scale growth and...

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Bibliographic Details
Published in:Journal of the American Chemical Society 2011-03, Vol.133 (11), p.3772-3775
Main Authors: Golks, Frederik, Krug, Klaus, Gründer, Yvonne, Zegenhagen, Jörg, Stettner, Jochim, Magnussen, Olaf M
Format: Article
Language:English
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Summary:We present in situ X-ray surface diffraction studies of interface processes with data acquisition rates in the millisecond regime, using the electrochemical dissolution of Au(001) in Cl-containing solution as an example. This progress in time resolution permits monitoring of atomic-scale growth and etching processes at solid−liquid interfaces at technologically relevant rates. Au etching was found to proceed via a layer-by-layer mechanism in the entire active dissolution regime up to rates of ∼20 ML/s. Furthermore, we demonstrate that information on the lateral surface morphology and in-plane lattice strain during the electrochemical process can be obtained.
ISSN:0002-7863
1520-5126
DOI:10.1021/ja1115748