Optical and mechanical studies on unidirectional grown tri-nitrophenol methyl p-hydroxybenzoate bulk single crystal

The bulk single crystal of tri-nitrophenol methyl p-hydroxybenzoate (TNMPHB) of length 90 mm and diameter 12 mm was obtained by employing unidirectional growth technique. Single crystal X-ray diffraction studies and powder XRD analysis have been carried out to confirm the identity of the crystal. Th...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 2010-10, Vol.405 (20), p.4274-4278
Main Authors: Uthrakumar, R., Vesta, C., Robert, R., Mangalam, G., Jerome Das, S.
Format: Article
Language:English
Subjects:
Band spectra
Characterization
Condensed matter
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Crystal defects
Crystals
Dielectric
Dielectric loss and relaxation
Dielectric properties of solids and liquids
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Diffraction
Exact sciences and technology
Growth from solutions
Mathematical analysis
Mechanical and acoustical properties of condensed matter
Mechanical properties of solids
Nonlinear optic materials
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Physics
Single crystal
Single crystals
Tribology and hardness
X-rays
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Summary:The bulk single crystal of tri-nitrophenol methyl p-hydroxybenzoate (TNMPHB) of length 90 mm and diameter 12 mm was obtained by employing unidirectional growth technique. Single crystal X-ray diffraction studies and powder XRD analysis have been carried out to confirm the identity of the crystal. The optical band gap of the grown crystal was calculated to be 4.91 eV from UV transmission spectrum. The mechanical strength of the grown crystal has been studied using Vicker's microhardness tester. Low dielectric loss shows that the grown crystal contains lesser defects authenticating the suitability of the crystal towards device applications. The surface morphology studies have been carried out on the grown crystal.
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2010.07.024