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Low-Power, High-Gain V-Band CMOS Low Noise Amplifier for Microwave Radiometer Applications
A low power and high gain V-band CMOS low-noise amplifier (LNA) is proposed in this letter with a three-stage cascode topology. Using the gate-inductive gain-peaking technique to boost the gain, the proposed LNA achieves a good figure of merit (FOM) with less power consumption. This proposed LNA is...
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Published in: | IEEE microwave and wireless components letters 2011-02, Vol.21 (2), p.104-106 |
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container_title | IEEE microwave and wireless components letters |
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creator | HUANG, Chun-Chieh KUO, Hsin-Chih HUANG, Tzuen-Hsi CHUANG, Huey-Ru |
description | A low power and high gain V-band CMOS low-noise amplifier (LNA) is proposed in this letter with a three-stage cascode topology. Using the gate-inductive gain-peaking technique to boost the gain, the proposed LNA achieves a good figure of merit (FOM) with less power consumption. This proposed LNA is fabricated in a 0.13 μm RF CMOS process, which achieves a peak gain of 21 dB at 53 GHz, a noise figure (NF) of 7.6 dB at 53 GHz, a 3 dB frequency bandwidth ranging from 51.3 to 55.8 GHz, an input 1 dB compression point (P 1 dB ) of - 25 dBm at 53 GHz, and an input third-order intercept point (IIP3) of -16 dBm. Also, the LNA consumes only 15.1 mW at a supply voltage of 1.5 V. The calculated FOM is 0.81 in average. Such a V-band LNA design is applicable to the cost-efficiency integration of a microwave radiometer front-end circuit over the operation frequency band of 52 to 56 GHz. |
doi_str_mv | 10.1109/LMWC.2010.2091401 |
format | article |
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Using the gate-inductive gain-peaking technique to boost the gain, the proposed LNA achieves a good figure of merit (FOM) with less power consumption. This proposed LNA is fabricated in a 0.13 μm RF CMOS process, which achieves a peak gain of 21 dB at 53 GHz, a noise figure (NF) of 7.6 dB at 53 GHz, a 3 dB frequency bandwidth ranging from 51.3 to 55.8 GHz, an input 1 dB compression point (P 1 dB ) of - 25 dBm at 53 GHz, and an input third-order intercept point (IIP3) of -16 dBm. Also, the LNA consumes only 15.1 mW at a supply voltage of 1.5 V. The calculated FOM is 0.81 in average. Such a V-band LNA design is applicable to the cost-efficiency integration of a microwave radiometer front-end circuit over the operation frequency band of 52 to 56 GHz.</description><identifier>ISSN: 1531-1309</identifier><identifier>ISSN: 2771-957X</identifier><identifier>EISSN: 1558-1764</identifier><identifier>EISSN: 2771-9588</identifier><identifier>DOI: 10.1109/LMWC.2010.2091401</identifier><identifier>CODEN: IMWCBJ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplifiers ; Applied sciences ; Cascode amplifier ; Circuit design ; Circuit properties ; CMOS ; CMOS integrated circuits ; Design. Technologies. Operation analysis. Testing ; Electric potential ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Gain ; gain peaking ; Integrated circuits ; Logic gates ; low noise amplifier (LNA) ; Microwave circuits ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; microwave radiometer ; Microwave radiometers ; Microwave radiometry ; millimeter-wave (MMW) ; Noise ; Noise levels ; Noise measurement ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Vanadium</subject><ispartof>IEEE microwave and wireless components letters, 2011-02, Vol.21 (2), p.104-106</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Feb 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c420t-f12f94fb46169d19b1af5a199ed065ddaa422ad9a8749fc14d08977e7948e37e3</citedby><cites>FETCH-LOGICAL-c420t-f12f94fb46169d19b1af5a199ed065ddaa422ad9a8749fc14d08977e7948e37e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5705520$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23896953$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>HUANG, Chun-Chieh</creatorcontrib><creatorcontrib>KUO, Hsin-Chih</creatorcontrib><creatorcontrib>HUANG, Tzuen-Hsi</creatorcontrib><creatorcontrib>CHUANG, Huey-Ru</creatorcontrib><title>Low-Power, High-Gain V-Band CMOS Low Noise Amplifier for Microwave Radiometer Applications</title><title>IEEE microwave and wireless components letters</title><addtitle>LMWC</addtitle><description>A low power and high gain V-band CMOS low-noise amplifier (LNA) is proposed in this letter with a three-stage cascode topology. Using the gate-inductive gain-peaking technique to boost the gain, the proposed LNA achieves a good figure of merit (FOM) with less power consumption. This proposed LNA is fabricated in a 0.13 μm RF CMOS process, which achieves a peak gain of 21 dB at 53 GHz, a noise figure (NF) of 7.6 dB at 53 GHz, a 3 dB frequency bandwidth ranging from 51.3 to 55.8 GHz, an input 1 dB compression point (P 1 dB ) of - 25 dBm at 53 GHz, and an input third-order intercept point (IIP3) of -16 dBm. Also, the LNA consumes only 15.1 mW at a supply voltage of 1.5 V. The calculated FOM is 0.81 in average. Such a V-band LNA design is applicable to the cost-efficiency integration of a microwave radiometer front-end circuit over the operation frequency band of 52 to 56 GHz.</description><subject>Amplifiers</subject><subject>Applied sciences</subject><subject>Cascode amplifier</subject><subject>Circuit design</subject><subject>Circuit properties</subject><subject>CMOS</subject><subject>CMOS integrated circuits</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electric potential</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Gain</subject><subject>gain peaking</subject><subject>Integrated circuits</subject><subject>Logic gates</subject><subject>low noise amplifier (LNA)</subject><subject>Microwave circuits</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>microwave radiometer</subject><subject>Microwave radiometers</subject><subject>Microwave radiometry</subject><subject>millimeter-wave (MMW)</subject><subject>Noise</subject><subject>Noise levels</subject><subject>Noise measurement</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Vanadium</subject><issn>1531-1309</issn><issn>2771-957X</issn><issn>1558-1764</issn><issn>2771-9588</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNpdkE1PGzEQhlcVSIXQH1BxsZAQF5Z61vaufQwRH5WSUvVT4mINu2Mw2qyDnRDx7-soEYeeZkbv845m3qL4DPwCgJsv09nfyUXF81hxA5LDh-IAlNIlNLXc2_QCShDcfCwOU3rmHKSWcFDcT8O6_B7WFM_ZrX98Km_QD-xPeYlDxyazu58sA-xb8InYeL7ovfMUmQuRzXwbwxpfif3Azoc5LbMwXmSkxaUPQzoq9h32iT7t6qj4fX31a3JbTu9uvk7G07KVFV-WDipnpHuQNdSmA_MA6BSCMdTxWnUdoqwq7AzqRhrXguy4Nk1DjZGaRENiVJxt9y5ieFlRWtq5Ty31PQ4UVsnqWgqjhawzefIf-RxWccjHWa1AAtTSZAi2UH4vpUjOLqKfY3yzwO0ma7vJ2m6ytruss-d0txhTi72LOLQ-vRsroU1tlMjc8ZbzRPQuq4YrVXHxD_LUhYg</recordid><startdate>20110201</startdate><enddate>20110201</enddate><creator>HUANG, Chun-Chieh</creator><creator>KUO, Hsin-Chih</creator><creator>HUANG, Tzuen-Hsi</creator><creator>CHUANG, Huey-Ru</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Testing</topic><topic>Electric potential</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Gain</topic><topic>gain peaking</topic><topic>Integrated circuits</topic><topic>Logic gates</topic><topic>low noise amplifier (LNA)</topic><topic>Microwave circuits</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>microwave radiometer</topic><topic>Microwave radiometers</topic><topic>Microwave radiometry</topic><topic>millimeter-wave (MMW)</topic><topic>Noise</topic><topic>Noise levels</topic><topic>Noise measurement</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Vanadium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>HUANG, Chun-Chieh</creatorcontrib><creatorcontrib>KUO, Hsin-Chih</creatorcontrib><creatorcontrib>HUANG, Tzuen-Hsi</creatorcontrib><creatorcontrib>CHUANG, Huey-Ru</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEL</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE microwave and wireless components letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>HUANG, Chun-Chieh</au><au>KUO, Hsin-Chih</au><au>HUANG, Tzuen-Hsi</au><au>CHUANG, Huey-Ru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Low-Power, High-Gain V-Band CMOS Low Noise Amplifier for Microwave Radiometer Applications</atitle><jtitle>IEEE microwave and wireless components letters</jtitle><stitle>LMWC</stitle><date>2011-02-01</date><risdate>2011</risdate><volume>21</volume><issue>2</issue><spage>104</spage><epage>106</epage><pages>104-106</pages><issn>1531-1309</issn><issn>2771-957X</issn><eissn>1558-1764</eissn><eissn>2771-9588</eissn><coden>IMWCBJ</coden><abstract>A low power and high gain V-band CMOS low-noise amplifier (LNA) is proposed in this letter with a three-stage cascode topology. Using the gate-inductive gain-peaking technique to boost the gain, the proposed LNA achieves a good figure of merit (FOM) with less power consumption. This proposed LNA is fabricated in a 0.13 μm RF CMOS process, which achieves a peak gain of 21 dB at 53 GHz, a noise figure (NF) of 7.6 dB at 53 GHz, a 3 dB frequency bandwidth ranging from 51.3 to 55.8 GHz, an input 1 dB compression point (P 1 dB ) of - 25 dBm at 53 GHz, and an input third-order intercept point (IIP3) of -16 dBm. Also, the LNA consumes only 15.1 mW at a supply voltage of 1.5 V. The calculated FOM is 0.81 in average. Such a V-band LNA design is applicable to the cost-efficiency integration of a microwave radiometer front-end circuit over the operation frequency band of 52 to 56 GHz.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LMWC.2010.2091401</doi><tpages>3</tpages></addata></record> |
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subjects | Amplifiers Applied sciences Cascode amplifier Circuit design Circuit properties CMOS CMOS integrated circuits Design. Technologies. Operation analysis. Testing Electric potential Electric, optical and optoelectronic circuits Electronic circuits Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Gain gain peaking Integrated circuits Logic gates low noise amplifier (LNA) Microwave circuits Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits microwave radiometer Microwave radiometers Microwave radiometry millimeter-wave (MMW) Noise Noise levels Noise measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Vanadium |
title | Low-Power, High-Gain V-Band CMOS Low Noise Amplifier for Microwave Radiometer Applications |
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