Effect of heat treatment on morphological, structural and optical properties of CoMTPP thin films

• Published in: Solid state sciences 2011-03, Vol.13 (3), p.596-600
• Main Authors: El-Nahass, M.M., Ammar, A.H., Farag, A.A.M., Atta, A.A., El-Zaidia, E.F.M.
• Format: Article
• Language: English
• Subjects: CoMTPP; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Constants; Crystal structures; Dielectric constant; Dispersions; Exact sciences and technology; Optical dispersion parameters; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Oscillators; Physics; Refractive index; Refractivity; Scanning electron microscopy; Spectra; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Thin films
• ISSN: 1293-2558; 1873-3085
• DOI: 10.1016/j.solidstatesciences.2010.12.032

The morphologies and crystal structures of 5,10,15,20-tetrakis(4-methoxyphenyl)-21 H,23 H-porphine cobalt(II), CoMTPP, thin films were investigated by scanning electron microscopy (SEM) and X-ray diffraction (XRD), respectively. Optical constants namely the refractive index, n, and the absorption index, k, of CoMTPP were estimated by using spectrophotometric measurements of transmittance and reflectance in the spectral range from 200 to 2500 nm. The dispersion of the refractive index in terms of the single oscillator in the transparent region is discussed. The single oscillator energy ( E 0), the dispersion energy ( E d ), the high frequency dielectric constant ( ɛ ∞) and the lattice dielectric constant ( ɛ L ) were calculated. The analysis of the spectral behavior of the absorption coefficient in the intrinsic absorption region reveals two indirect allowed transitions for as-deposited and annealed films. [Display omitted]