Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy

The structure of binary Ge x S 100 − x chalcogenide glasses (10 < x < 30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetra...

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Bibliographic Details
Published in:Journal of non-crystalline solids 2011-04, Vol.357 (7), p.1797-1803
Main Authors: Golovchak, R., Shpotyuk, O., Kozyukhin, S., Shpotyuk, M., Kovalskiy, A., Jain, H.
Format: Article
Language:English
Subjects:
Chalcogenide glass
Chalcogenides
Electronic and atomic structure
Evolution
Germanium
Glass
Photoelectron spectroscopy
Short range order
Spectra
X-ray photoelectron spectroscopy
X-rays
XPS
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Summary:The structure of binary Ge x S 100 − x chalcogenide glasses (10 < x < 30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. It is shown that short-range order of these glasses includes fragments of high-temperature crystalline form of GeS 2. When subjected to X-irradiation, the structure of investigated glasses appears to become more homogeneous than that of the as-prepared samples. ► In this study we report XPS data for binary Ge–S glasses model. ► The short-range structure of these materials is determined. ► The influence of X-ray irradiation on their structure is emphasized.
ISSN:0022-3093
1873-4812
DOI:10.1016/j.jnoncrysol.2011.02.005