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Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy
The structure of binary Ge x S 100 − x chalcogenide glasses (10 < x < 30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetra...
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| Published in: | Journal of non-crystalline solids 2011-04, Vol.357 (7), p.1797-1803 |
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| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c350t-17fedc2852310f8ba4405eb8a08615754d857a076019b4101bf74467b44684a73 |
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| cites | cdi_FETCH-LOGICAL-c350t-17fedc2852310f8ba4405eb8a08615754d857a076019b4101bf74467b44684a73 |
| container_end_page | 1803 |
| container_issue | 7 |
| container_start_page | 1797 |
| container_title | Journal of non-crystalline solids |
| container_volume | 357 |
| creator | Golovchak, R. Shpotyuk, O. Kozyukhin, S. Shpotyuk, M. Kovalskiy, A. Jain, H. |
| description | The structure of binary Ge
x
S
100
−
x
chalcogenide glasses (10
<
x
<
30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. It is shown that short-range order of these glasses includes fragments of high-temperature crystalline form of GeS
2. When subjected to X-irradiation, the structure of investigated glasses appears to become more homogeneous than that of the as-prepared samples.
► In this study we report XPS data for binary Ge–S glasses model. ► The short-range structure of these materials is determined. ► The influence of X-ray irradiation on their structure is emphasized. |
| doi_str_mv | 10.1016/j.jnoncrysol.2011.02.005 |
| format | article |
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x
S
100
−
x
chalcogenide glasses (10
<
x
<
30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. It is shown that short-range order of these glasses includes fragments of high-temperature crystalline form of GeS
2. When subjected to X-irradiation, the structure of investigated glasses appears to become more homogeneous than that of the as-prepared samples.
► In this study we report XPS data for binary Ge–S glasses model. ► The short-range structure of these materials is determined. ► The influence of X-ray irradiation on their structure is emphasized.</description><identifier>ISSN: 0022-3093</identifier><identifier>EISSN: 1873-4812</identifier><identifier>DOI: 10.1016/j.jnoncrysol.2011.02.005</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Chalcogenide glass ; Chalcogenides ; Electronic and atomic structure ; Evolution ; Germanium ; Glass ; Photoelectron spectroscopy ; Short range order ; Spectra ; X-ray photoelectron spectroscopy ; X-rays ; XPS</subject><ispartof>Journal of non-crystalline solids, 2011-04, Vol.357 (7), p.1797-1803</ispartof><rights>2011 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-17fedc2852310f8ba4405eb8a08615754d857a076019b4101bf74467b44684a73</citedby><cites>FETCH-LOGICAL-c350t-17fedc2852310f8ba4405eb8a08615754d857a076019b4101bf74467b44684a73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Golovchak, R.</creatorcontrib><creatorcontrib>Shpotyuk, O.</creatorcontrib><creatorcontrib>Kozyukhin, S.</creatorcontrib><creatorcontrib>Shpotyuk, M.</creatorcontrib><creatorcontrib>Kovalskiy, A.</creatorcontrib><creatorcontrib>Jain, H.</creatorcontrib><title>Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy</title><title>Journal of non-crystalline solids</title><description>The structure of binary Ge
x
S
100
−
x
chalcogenide glasses (10
<
x
<
30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. It is shown that short-range order of these glasses includes fragments of high-temperature crystalline form of GeS
2. When subjected to X-irradiation, the structure of investigated glasses appears to become more homogeneous than that of the as-prepared samples.
► In this study we report XPS data for binary Ge–S glasses model. ► The short-range structure of these materials is determined. ► The influence of X-ray irradiation on their structure is emphasized.</description><subject>Chalcogenide glass</subject><subject>Chalcogenides</subject><subject>Electronic and atomic structure</subject><subject>Evolution</subject><subject>Germanium</subject><subject>Glass</subject><subject>Photoelectron spectroscopy</subject><subject>Short range order</subject><subject>Spectra</subject><subject>X-ray photoelectron spectroscopy</subject><subject>X-rays</subject><subject>XPS</subject><issn>0022-3093</issn><issn>1873-4812</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqFkE1OwzAQhS0EEqVwB-9YJYzjJHaWUPEnIbEoSN1ZjjOhrkIc7LRSdtyBG3ISDEViySxmZvHeaN5HCGWQMmDlxSbd9K43fgquSzNgLIUsBSgOyIxJwZNcsuyQzACyLOFQ8WNyEsIGYgkuZ2S1XDs_Jl73L0idb9BT3LluO1rXU9vTZeKtWdNb_Hz_WNKXToeAgdYTXUXPRIe1Gx12aEYf9WH4WYJxw3RKjlrdBTz7nXPyfHP9tLhLHh5v7xeXD4nhBYwJEy02JpNFxhm0stZ5DgXWUoMsWSGKvJGF0CBKYFWdx8R1K_K8FHVsMteCz8n5_u7g3dsWw6hebTDYdbpHtw1KlpXklah4VMq90sQXg8dWDd6-aj8pBuqbpdqoP5bqm6WCTEWW0Xq1t2JMsrPoVTAWe4ON9TGyapz9_8gXC3eDcg</recordid><startdate>20110401</startdate><enddate>20110401</enddate><creator>Golovchak, R.</creator><creator>Shpotyuk, O.</creator><creator>Kozyukhin, S.</creator><creator>Shpotyuk, M.</creator><creator>Kovalskiy, A.</creator><creator>Jain, H.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope><scope>KR7</scope><scope>L7M</scope></search><sort><creationdate>20110401</creationdate><title>Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy</title><author>Golovchak, R. ; Shpotyuk, O. ; Kozyukhin, S. ; Shpotyuk, M. ; Kovalskiy, A. ; Jain, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-17fedc2852310f8ba4405eb8a08615754d857a076019b4101bf74467b44684a73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Chalcogenide glass</topic><topic>Chalcogenides</topic><topic>Electronic and atomic structure</topic><topic>Evolution</topic><topic>Germanium</topic><topic>Glass</topic><topic>Photoelectron spectroscopy</topic><topic>Short range order</topic><topic>Spectra</topic><topic>X-ray photoelectron spectroscopy</topic><topic>X-rays</topic><topic>XPS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Golovchak, R.</creatorcontrib><creatorcontrib>Shpotyuk, O.</creatorcontrib><creatorcontrib>Kozyukhin, S.</creatorcontrib><creatorcontrib>Shpotyuk, M.</creatorcontrib><creatorcontrib>Kovalskiy, A.</creatorcontrib><creatorcontrib>Jain, H.</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of non-crystalline solids</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Golovchak, R.</au><au>Shpotyuk, O.</au><au>Kozyukhin, S.</au><au>Shpotyuk, M.</au><au>Kovalskiy, A.</au><au>Jain, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy</atitle><jtitle>Journal of non-crystalline solids</jtitle><date>2011-04-01</date><risdate>2011</risdate><volume>357</volume><issue>7</issue><spage>1797</spage><epage>1803</epage><pages>1797-1803</pages><issn>0022-3093</issn><eissn>1873-4812</eissn><abstract>The structure of binary Ge
x
S
100
−
x
chalcogenide glasses (10
<
x
<
30) is determined by high-resolution X-ray photoelectron spectroscopy (XPS). On the basis of compositional dependence of fitting parameters for Ge and S core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. It is shown that short-range order of these glasses includes fragments of high-temperature crystalline form of GeS
2. When subjected to X-irradiation, the structure of investigated glasses appears to become more homogeneous than that of the as-prepared samples.
► In this study we report XPS data for binary Ge–S glasses model. ► The short-range structure of these materials is determined. ► The influence of X-ray irradiation on their structure is emphasized.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.jnoncrysol.2011.02.005</doi><tpages>7</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0022-3093 |
| ispartof | Journal of non-crystalline solids, 2011-04, Vol.357 (7), p.1797-1803 |
| issn | 0022-3093 1873-4812 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_869839793 |
| source | ScienceDirect Journals |
| subjects | Chalcogenide glass Chalcogenides Electronic and atomic structure Evolution Germanium Glass Photoelectron spectroscopy Short range order Spectra X-ray photoelectron spectroscopy X-rays XPS |
| title | Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy |
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