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Observation of polytype stability in different-impurities-doped 6H–SiC crystals
The Al–B co-doped 6H–SiC and heavily N-doped 6H–SiC crystals grown by physical vapor transport method were investigated in this paper, respectively. The XPS (x-ray photoelectron spectroscope), Raman spectra analysis and XRD (X-ray diffraction) were applied to characterize the obtained SiC crystals....
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Published in: | Diamond and related materials 2011-04, Vol.20 (4), p.516-519 |
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Main Authors: | , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The Al–B co-doped 6H–SiC and heavily N-doped 6H–SiC crystals grown by physical vapor transport method were investigated in this paper, respectively. The XPS (x-ray photoelectron spectroscope), Raman spectra analysis and XRD (X-ray diffraction) were applied to characterize the obtained SiC crystals. When the co-doping level with a ratio of B:Al
=
0.22at.%:0.34at.% was obtained, Raman spectra results showed that there existed the 15R-polytype inclusion in the 6H–SiC crystal. When the co-doping ratio of B and Al increased to 1.18at.%:0.34at.%, there was only one polytype (6H) in the whole wafer. It can be speculated that the co-doping ratio of B:Al
=
1.18at.%:0.34at.% may stabilize the crystal structure during the 6H–SiC crystal growth process. But the real mechanism of the polytype stability is unclear. The role of Al or B or other impurities to influence polytype stability will be further investigated in the future work. Moreover, it has been found that a high nitrogen doping level can influence the polytype stability during the 6H–SiC crystal growth process. And especially, the 4H-polytype is preferred.
► 15R-polytype inclusion existed in the 6H-SiC crystal when B:Al=0.22at%:0.34at%. ► B:Al=1.18at%:0.34at% may stabilize crystal structure during 6H-SiC crystal growth. ► 4H-polytype is preferred in heavily nitrogen-doped 6H-SiC crystals. |
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ISSN: | 0925-9635 1879-0062 |
DOI: | 10.1016/j.diamond.2011.02.011 |