Loading…

Image sensor as a three-channel spectrometer with application to in situ monitoring of wet etching

A three-channel spectrometer is constructed with a 460 nm high brightness light-emitting diode (LED) source (250 mW peak optical power output, 1 mm sq, 150 μm thick) and a red-green-blue (RGB) image sensor (3 × 4 mm, 1 mm thick) for purposes of a small form factor spectrometer to monitor reflectance...

Full description

Saved in:
Bibliographic Details
Published in:Review of scientific instruments 2011-07, Vol.82 (7), p.075103-075103-7
Main Authors: Gerling, John, Cheung, Nathan W.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites cdi_FETCH-LOGICAL-c299t-f8881cef20ce9a16b7ed7d5fb40d40ee30ca62f6f341795ff40306666323d1c33
container_end_page 075103-7
container_issue 7
container_start_page 075103
container_title Review of scientific instruments
container_volume 82
creator Gerling, John
Cheung, Nathan W.
description A three-channel spectrometer is constructed with a 460 nm high brightness light-emitting diode (LED) source (250 mW peak optical power output, 1 mm sq, 150 μm thick) and a red-green-blue (RGB) image sensor (3 × 4 mm, 1 mm thick) for purposes of a small form factor spectrometer to monitor reflectance/emission spectra from chemical wet etching experiments. The linearity and spectral response of the RGB image sensor is characterized and a three-channel spectral model is fitted to the extracted spectral response. We use this information to quantify time developments of the RGB image sensor outputs for in situ copper and aluminum etching experiments in terms of three defined spectral bands.
doi_str_mv 10.1063/1.3606445
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_880999197</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>880999197</sourcerecordid><originalsourceid>FETCH-LOGICAL-c299t-f8881cef20ce9a16b7ed7d5fb40d40ee30ca62f6f341795ff40306666323d1c33</originalsourceid><addsrcrecordid>eNp1kE9LwzAYh4Mobk4PfgHJTTxUk6ZLm4sgwz-DgRc9hzR9s0bapiYpw29vXac3f5eXFx6ew4PQJSW3lHB2R28ZJzzLlkdoTkkhkpyn7BjNCWFZwvOsmKGzED7IuCWlp2iW0oLwNGVzVK5btQUcoAvOYxWwwrH2AImuVddBg0MPOnrXQgSPdzbWWPV9Y7WK1nU4Omw7HGwccOs6G5233RY7g3cQMURdj-85OjGqCXBxuAv0_vT4tnpJNq_P69XDJtGpEDExRVFQDSYlGoSivMyhyqulKTNSZQSAEa14arhhGc3F0piMMMLHsZRVVDO2QNeTt_fuc4AQZWuDhqZRHbghyKIgQggq8pG8mUjtXQgejOy9bZX_kpTIn6KSykPRkb06WIeyheqP_E04AvcTELSN-yr_2_ax5RRbqiCVjDX7Bkq8hms</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>880999197</pqid></control><display><type>article</type><title>Image sensor as a three-channel spectrometer with application to in situ monitoring of wet etching</title><source>American Institute of Physics (AIP) Publications</source><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Gerling, John ; Cheung, Nathan W.</creator><creatorcontrib>Gerling, John ; Cheung, Nathan W.</creatorcontrib><description>A three-channel spectrometer is constructed with a 460 nm high brightness light-emitting diode (LED) source (250 mW peak optical power output, 1 mm sq, 150 μm thick) and a red-green-blue (RGB) image sensor (3 × 4 mm, 1 mm thick) for purposes of a small form factor spectrometer to monitor reflectance/emission spectra from chemical wet etching experiments. The linearity and spectral response of the RGB image sensor is characterized and a three-channel spectral model is fitted to the extracted spectral response. We use this information to quantify time developments of the RGB image sensor outputs for in situ copper and aluminum etching experiments in terms of three defined spectral bands.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.3606445</identifier><identifier>PMID: 21806223</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>Aluminum - chemistry ; Copper - chemistry ; Spectrum Analysis - methods ; Time Factors</subject><ispartof>Review of scientific instruments, 2011-07, Vol.82 (7), p.075103-075103-7</ispartof><rights>2011 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c299t-f8881cef20ce9a16b7ed7d5fb40d40ee30ca62f6f341795ff40306666323d1c33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.3606445$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,27924,27925,76383</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21806223$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Gerling, John</creatorcontrib><creatorcontrib>Cheung, Nathan W.</creatorcontrib><title>Image sensor as a three-channel spectrometer with application to in situ monitoring of wet etching</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>A three-channel spectrometer is constructed with a 460 nm high brightness light-emitting diode (LED) source (250 mW peak optical power output, 1 mm sq, 150 μm thick) and a red-green-blue (RGB) image sensor (3 × 4 mm, 1 mm thick) for purposes of a small form factor spectrometer to monitor reflectance/emission spectra from chemical wet etching experiments. The linearity and spectral response of the RGB image sensor is characterized and a three-channel spectral model is fitted to the extracted spectral response. We use this information to quantify time developments of the RGB image sensor outputs for in situ copper and aluminum etching experiments in terms of three defined spectral bands.</description><subject>Aluminum - chemistry</subject><subject>Copper - chemistry</subject><subject>Spectrum Analysis - methods</subject><subject>Time Factors</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kE9LwzAYh4Mobk4PfgHJTTxUk6ZLm4sgwz-DgRc9hzR9s0bapiYpw29vXac3f5eXFx6ew4PQJSW3lHB2R28ZJzzLlkdoTkkhkpyn7BjNCWFZwvOsmKGzED7IuCWlp2iW0oLwNGVzVK5btQUcoAvOYxWwwrH2AImuVddBg0MPOnrXQgSPdzbWWPV9Y7WK1nU4Omw7HGwccOs6G5233RY7g3cQMURdj-85OjGqCXBxuAv0_vT4tnpJNq_P69XDJtGpEDExRVFQDSYlGoSivMyhyqulKTNSZQSAEa14arhhGc3F0piMMMLHsZRVVDO2QNeTt_fuc4AQZWuDhqZRHbghyKIgQggq8pG8mUjtXQgejOy9bZX_kpTIn6KSykPRkb06WIeyheqP_E04AvcTELSN-yr_2_ax5RRbqiCVjDX7Bkq8hms</recordid><startdate>20110701</startdate><enddate>20110701</enddate><creator>Gerling, John</creator><creator>Cheung, Nathan W.</creator><general>American Institute of Physics</general><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20110701</creationdate><title>Image sensor as a three-channel spectrometer with application to in situ monitoring of wet etching</title><author>Gerling, John ; Cheung, Nathan W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c299t-f8881cef20ce9a16b7ed7d5fb40d40ee30ca62f6f341795ff40306666323d1c33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Aluminum - chemistry</topic><topic>Copper - chemistry</topic><topic>Spectrum Analysis - methods</topic><topic>Time Factors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gerling, John</creatorcontrib><creatorcontrib>Cheung, Nathan W.</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gerling, John</au><au>Cheung, Nathan W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Image sensor as a three-channel spectrometer with application to in situ monitoring of wet etching</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2011-07-01</date><risdate>2011</risdate><volume>82</volume><issue>7</issue><spage>075103</spage><epage>075103-7</epage><pages>075103-075103-7</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>A three-channel spectrometer is constructed with a 460 nm high brightness light-emitting diode (LED) source (250 mW peak optical power output, 1 mm sq, 150 μm thick) and a red-green-blue (RGB) image sensor (3 × 4 mm, 1 mm thick) for purposes of a small form factor spectrometer to monitor reflectance/emission spectra from chemical wet etching experiments. The linearity and spectral response of the RGB image sensor is characterized and a three-channel spectral model is fitted to the extracted spectral response. We use this information to quantify time developments of the RGB image sensor outputs for in situ copper and aluminum etching experiments in terms of three defined spectral bands.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>21806223</pmid><doi>10.1063/1.3606445</doi><tpages>1</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0034-6748
ispartof Review of scientific instruments, 2011-07, Vol.82 (7), p.075103-075103-7
issn 0034-6748
1089-7623
language eng
recordid cdi_proquest_miscellaneous_880999197
source American Institute of Physics (AIP) Publications; American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects Aluminum - chemistry
Copper - chemistry
Spectrum Analysis - methods
Time Factors
title Image sensor as a three-channel spectrometer with application to in situ monitoring of wet etching
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T13%3A27%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Image%20sensor%20as%20a%20three-channel%20spectrometer%20with%20application%20to%20in%20situ%20monitoring%20of%20wet%20etching&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Gerling,%20John&rft.date=2011-07-01&rft.volume=82&rft.issue=7&rft.spage=075103&rft.epage=075103-7&rft.pages=075103-075103-7&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.3606445&rft_dat=%3Cproquest_cross%3E880999197%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c299t-f8881cef20ce9a16b7ed7d5fb40d40ee30ca62f6f341795ff40306666323d1c33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=880999197&rft_id=info:pmid/21806223&rfr_iscdi=true