Approaching the Theoretical Elastic Strain Limit in Copper Nanowires

Three sets of uniaxial tensile tests have been performed in situ in transmission electron microscopy/high-resolution electron microscopy on Cu nanowires (NWs) to accurately map out the sample size dependence of elastic strain limit. Atomic-resolution evidence was obtained for an exceedingly large re...

Full description

Saved in:
Bibliographic Details
Published in:Nano letters 2011-08, Vol.11 (8), p.3151-3155
Main Authors: Yue, Yonghai, Liu, Pan, Zhang, Ze, Han, Xiaodong, Ma, En
Format: Article
Language:English
Subjects:
COMPUTER SIMULATION
Condensed matter: structure, mechanical and thermal properties
Copper
Cross-disciplinary physics: materials science
rheology
ELASTIC LIMIT
ELASTIC STRAIN
Electron microscopy
Exact sciences and technology
Lattices
LATTICES (CRYSTAL)
Materials science
MATHEMATICAL ANALYSIS
Mechanical and acoustical properties of condensed matter
Mechanical properties of nanoscale materials
MICROWIRE
Molecular dynamics
Nanocrystalline materials
Nanoscale materials and structures: fabrication and characterization
Nanowires
Physics
Quantum wires
Simulation
STRAIN
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Three sets of uniaxial tensile tests have been performed in situ in transmission electron microscopy/high-resolution electron microscopy on Cu nanowires (NWs) to accurately map out the sample size dependence of elastic strain limit. Atomic-resolution evidence was obtained for an exceedingly large recoverable strain (as much as 7.2%) that can be sustained in the lattice of a single-crystalline Cu NW with a diameter of ∼5.8 nm. This ultrahigh elastic strain is consistent with the predictions from molecular dynamics simulations for nanowires and approaches the ideal elastic limit predicted for Cu by ab initio calculations.
ISSN:1530-6984
1530-6992
DOI:10.1021/nl201233u