RF MEMS Testing - Beyond the S-Parameters

This article surveys a variety of tests and measurements that have been used for switch and relay characterization, and it describes their strengths, weaknesses, and applicability in the design and development process.

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Bibliographic Details
Published in:IEEE microwave magazine 2007-12, Vol.8 (6), p.76-88
Main Authors: Ebel, J.L., Hyman, D.J., Newman, H.S.
Format: Magazinearticle
Language:English
Subjects:
Contact resistance
Dielectric losses
Insertion loss
Microwaves
Radio frequencies
Radio frequency
Radiofrequency microelectromechanical systems
Relay
Resonance
Scattering parameters
Strength
Surveys
Switches
System testing
Voltage
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Description
Summary:This article surveys a variety of tests and measurements that have been used for switch and relay characterization, and it describes their strengths, weaknesses, and applicability in the design and development process.
ISSN:1527-3342
1557-9581
DOI:10.1109/MMM.2007.907737