Reduced Probability of Noise Introduced Malfunction in RSFQ Circuits by Implementing Intrinsic \pi-Phaseshifter

The rapid single flux quantum electronics is characterized by a low switching energy, which makes it susceptible to noise introduced bit-errors. For industrial applications a certain noise immunity is required which is still a challenge especially for circuits of higher complexity. We analysed the i...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2009-06, Vol.19 (3), p.621-625
Main Authors: Mielke, O., Ortlepp, T., Febvre, P., Uhlmann, F.H.
Format: Article
Language:English
Subjects:
Applied sciences
Bit error rate
Bit-error rate (BER)
Capacitors. Resistors. Filters
circuit design
Circuit noise
Circuit testing
Circuits
Design. Technologies. Operation analysis. Testing
Electrical engineering. Electrical power engineering
Electromagnets
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Fabrication
Flip-flops
Flux
Integrated circuits
Logic devices
Niobium
Noise
Noise reduction
Phase noise
pi -phaseshifter
Quantum electronics
Resistors
RSFQ
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting device noise
Superconductivity
Switching
thermal noise
Various equipment and components
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Description
Summary:The rapid single flux quantum electronics is characterized by a low switching energy, which makes it susceptible to noise introduced bit-errors. For industrial applications a certain noise immunity is required which is still a challenge especially for circuits of higher complexity. We analysed the influence of each individual resistor in a toggle flip-flop circuit to the overall bit-error rate. The shunt resistors of comparator structures are the dominant noise sources and bias resistors have almost no influence.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2009.2018145