Local conductivity of epitaxial Fe-doped SrTiO3 thin films

Atomic Force Microscopy (AFM) measurements have been performed for Fe-doped SrTiO 3 thin films with an Fe concentration of 1 and 2 at%. Thin films with a thickness of 15-50 nm were grown by pulsed laser deposition on single crystalline SrTi 0.99 Nb 0.01 O 3 substrates. Low-energy electron diffractio...

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Bibliographic Details
Published in:Phase transitions 2011-05, Vol.84 (5-6), p.483-488
Main Authors: Kajewski, D., Wrzalik, R., Wojtyniak, M., Pilch, M., Szade, J., Szot, K., Lenser, Ch, Dittmann, R., Waser, R.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Crystal structure
Doping
Electric potential
Iron
local conductivity
perovskites
resistive switching
strontium titanate
Strontium titanates
Switching
Thin films
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Summary:Atomic Force Microscopy (AFM) measurements have been performed for Fe-doped SrTiO 3 thin films with an Fe concentration of 1 and 2 at%. Thin films with a thickness of 15-50 nm were grown by pulsed laser deposition on single crystalline SrTi 0.99 Nb 0.01 O 3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6 V) showed inhomogeneity of the electrical conductivity. Resistive switching was studied by the use of local conductive atomic force microscopy and was present in all samples. Fe doping was found to influence the character of switching.
ISSN:0141-1594
1029-0338
DOI:10.1080/01411594.2010.551751