Reliability of 4.6-μm quantum cascade lasers under continuous-wave room-temperature operation

We report the life test results for 9 4.6- mu m planar buried heterostructure quantum cascade lasers made of strain-balanced GaInAs/AlInAs/InP materials grown by metal organic vapor-phase epitaxy. No facet coating was deposited, and the devices were mounted on CuW submounts using AuSn solder. The ag...

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Bibliographic Details
Published in:Optical engineering 2010-11, Vol.49 (11), p.111104
Main Author: Xie, Feng
Format: Article
Language:English
Subjects:
Continuous wave
Current density
Deposition
Devices
Epitaxy
Indium phosphides
Lasers
Quantum cascade lasers
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Summary:We report the life test results for 9 4.6- mu m planar buried heterostructure quantum cascade lasers made of strain-balanced GaInAs/AlInAs/InP materials grown by metal organic vapor-phase epitaxy. No facet coating was deposited, and the devices were mounted on CuW submounts using AuSn solder. The aging condition is continuous wave operation at a heat-sink temperature of 22 degree C with a constant current of 0.85, corresponding to current densities of 4.7 and 2.7 k/cm super(2), for lasers with widths of 4 and 7 mu m, respectively. All lasers survived 5000 h aging, and most devices showed improved performance during the first 1000 h of aging.
ISSN:0091-3286
DOI:10.1117/1.3498776