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Correlation Between Enhanced T c , the Unit Cell Volume and AC Magnetic Shielding in Argon Preheated ( Y 1 - x Eu x ) ( SrBa ) Cu 3 O 6 + z
We report here on the preparation, X-ray diffraction with Rietveld refinement, resistivity and AC magnetic susceptibility measurements of ( Y 1 - x Eu x ) ( SrBa ) Cu 3 O 6.94 . Each sample was subject to two types of heat treatment: oxygen annealing [O] and argon annealing followed by oxygen anneal...
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Published in: | IEEE transactions on applied superconductivity 2011-06, Vol.21 (3), p.2732-2736 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | We report here on the preparation, X-ray diffraction with Rietveld refinement, resistivity and AC magnetic susceptibility measurements of ( Y 1 - x Eu x ) ( SrBa ) Cu 3 O 6.94 . Each sample was subject to two types of heat treatment: oxygen annealing [O] and argon annealing followed by oxygen annealing [AO]. For each x, the [AO] treatment increases the orthorhombicity epsilon (for 0 less than or equal to x less than or equal to 1 ), T c (for x greater than or equal to 0.45 ) and by 6 K to 87 K for x = 1 [AO], and the distance d [ Cu ( 1 ) - Sr / Ba ] (decrease T c ) for x < 0.4 and decrease it (increase T c ) for x Unknown character 0.4 . In the normal state, the [AO] treatment reduced the linear resistivity parameters indicating a diminution of the interaction of carrier charges with phonons. There was a remarkable improvement in the shielding effect S (amplitude of chi ' ( T ) ) in the case of the samples [AO] at all T Unknown character T c and for any applied field for x Unknown character 0.5 . For each x and heat treatment, S(x) decreases when H dc and the temperature increase. Remarkable correlations were observed. A combination of several factors such as decrease in d [ Cu ( 1 ) - ( Sr / Ba ) ] ; increase in cationic and chain oxygen ordering; p Sh and in-phase purity for the [AO] samples may account for the observed data. |
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ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/TASC.2010.2088372 |