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Design of optimum component test plans in the demonstration of diverse system performance measures
While component-level tests have many advantages over system-level tests, the actual protection offered in making inferences about system reliability is not the same as what is expected. Thus, a significant proportion of research has concentrated on the design of system-based component test plans th...
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Published in: | IIE transactions 2011-07, Vol.43 (7), p.535-546 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | While component-level tests have many advantages over system-level tests, the actual protection offered in making inferences about system reliability is not the same as what is expected. Thus, a significant proportion of research has concentrated on the design of system-based component test plans that also have minimum cost. This article extends those previous studies by considering two additional system performance measures: expected system lifetime and system availability. After explicitly expressing these performance measures as a function of failure rates for various system types, the component testing problem is formulated as a semi-infinite linear programming problem and solved with a column generation technique incorporating signomial geometric programming. Several numerical examples are presented that provide insight on the model parameters. |
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ISSN: | 0740-817X 2472-5854 1545-8830 2472-5862 |
DOI: | 10.1080/0740817X.2010.523768 |