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Synthesis and characterization of nanocrystalline TiO2 thin films

Nanocrystalline thin films of TiO 2 have been synthesized by sol gel spin coating technique Thin films of TiO 2 annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2011-03, Vol.22 (3), p.260-264
Main Authors: Pawar, S. G., Patil, S. L., Chougule, M. A., Jundale, D. M., Patil, V. B.
Format: Article
Language:English
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Summary:Nanocrystalline thin films of TiO 2 have been synthesized by sol gel spin coating technique Thin films of TiO 2 annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal anatase and rutile phases with lattice parameters a  = 3.7837 Å and c  = 9.5087 Å. The surface morphology of the TiO 2 films showed that the nanoparticles are fine with an average grain size of about 60 nm. Optical studies revealed a high absorption coefficient (10 4  cm −1 ) with a direct band gap of 3.24 eV. The films are of the n type conduction with room temperature electrical conductivity of 10 −6 (Ω cm) −1 .
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-010-0125-8