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Synthesis and characterization of nanocrystalline TiO2 thin films
Nanocrystalline thin films of TiO 2 have been synthesized by sol gel spin coating technique Thin films of TiO 2 annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal...
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| Published in: | Journal of materials science. Materials in electronics 2011-03, Vol.22 (3), p.260-264 |
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| Main Authors: | , , , , |
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| cited_by | cdi_FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3 |
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| cites | cdi_FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3 |
| container_end_page | 264 |
| container_issue | 3 |
| container_start_page | 260 |
| container_title | Journal of materials science. Materials in electronics |
| container_volume | 22 |
| creator | Pawar, S. G. Patil, S. L. Chougule, M. A. Jundale, D. M. Patil, V. B. |
| description | Nanocrystalline thin films of TiO
2
have been synthesized by sol gel spin coating technique Thin films of TiO
2
annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal anatase and rutile phases with lattice parameters
a
= 3.7837 Å and
c
= 9.5087 Å. The surface morphology of the TiO
2
films showed that the nanoparticles are fine with an average grain size of about 60 nm. Optical studies revealed a high absorption coefficient (10
4
cm
−1
) with a direct band gap of 3.24 eV. The films are of the
n
type conduction with room temperature electrical conductivity of 10
−6
(Ω cm)
−1
. |
| doi_str_mv | 10.1007/s10854-010-0125-8 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_896218303</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2258239081</sourcerecordid><originalsourceid>FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3</originalsourceid><addsrcrecordid>eNp9kM1rGzEQxUVpoG7SP6C3JVCayyYz-tiVjibkCww5JIHcxFjWxjJrrSutD85fHxmHFArNYZjD_N5j3mPsJ8I5ArQXGUErWQNCGa5q_YVNULWilpo_f2UTMKqtpeL8G_ue8woAGin0hE0fdnFc-hxyRXFRuSUlcqNP4ZXGMMRq6KpIcXBpl0fq-xB99RjueTUuQ6y60K_zCTvqqM_-x_s-Zk_XV4-Xt_Xs_ubucjqrnZAw1oJDq8gt0HecyHDp0PE5KiEWnW5AtkRNS63rAOcoPJk5Gq45zsGUZOjFMft98N2k4c_W59GuQ3a-7yn6YZutNg1HLUAU8uxTEhvDhWzKRwU9_QddDdsUSw6rpRHYCq0LhAfIpSHn5Du7SWFNaWcR7L59e2jflvbtvn271_x6N6bsqO8SRRfyh5AL3aBSpnD8wOVyii8-_X3g_-ZvUR6SkQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>849317388</pqid></control><display><type>article</type><title>Synthesis and characterization of nanocrystalline TiO2 thin films</title><source>Springer Nature</source><creator>Pawar, S. G. ; Patil, S. L. ; Chougule, M. A. ; Jundale, D. M. ; Patil, V. B.</creator><creatorcontrib>Pawar, S. G. ; Patil, S. L. ; Chougule, M. A. ; Jundale, D. M. ; Patil, V. B.</creatorcontrib><description>Nanocrystalline thin films of TiO
2
have been synthesized by sol gel spin coating technique Thin films of TiO
2
annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal anatase and rutile phases with lattice parameters
a
= 3.7837 Å and
c
= 9.5087 Å. The surface morphology of the TiO
2
films showed that the nanoparticles are fine with an average grain size of about 60 nm. Optical studies revealed a high absorption coefficient (10
4
cm
−1
) with a direct band gap of 3.24 eV. The films are of the
n
type conduction with room temperature electrical conductivity of 10
−6
(Ω cm)
−1
.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-010-0125-8</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Annealing ; Applied sciences ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Cold working, work hardening; annealing, quenching, tempering, recovery, and recrystallization; textures ; Cross-disciplinary physics: materials science; rheology ; Electronics ; Exact sciences and technology ; Heat treatment ; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids) ; Materials Science ; Materials synthesis; materials processing ; Metals. Metallurgy ; Methods of deposition of films and coatings; film growth and epitaxy ; Nanocrystals ; Optical and Electronic Materials ; Physics ; Production techniques ; Rutile ; Sol gel process ; Spin coating ; Thin films ; Titanium dioxide ; Treatment of materials and its effects on microstructure and properties</subject><ispartof>Journal of materials science. Materials in electronics, 2011-03, Vol.22 (3), p.260-264</ispartof><rights>Springer Science+Business Media, LLC 2010</rights><rights>2015 INIST-CNRS</rights><rights>Springer Science+Business Media, LLC 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3</citedby><cites>FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23861559$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Pawar, S. G.</creatorcontrib><creatorcontrib>Patil, S. L.</creatorcontrib><creatorcontrib>Chougule, M. A.</creatorcontrib><creatorcontrib>Jundale, D. M.</creatorcontrib><creatorcontrib>Patil, V. B.</creatorcontrib><title>Synthesis and characterization of nanocrystalline TiO2 thin films</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Nanocrystalline thin films of TiO
2
have been synthesized by sol gel spin coating technique Thin films of TiO
2
annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal anatase and rutile phases with lattice parameters
a
= 3.7837 Å and
c
= 9.5087 Å. The surface morphology of the TiO
2
films showed that the nanoparticles are fine with an average grain size of about 60 nm. Optical studies revealed a high absorption coefficient (10
4
cm
−1
) with a direct band gap of 3.24 eV. The films are of the
n
type conduction with room temperature electrical conductivity of 10
−6
(Ω cm)
−1
.</description><subject>Annealing</subject><subject>Applied sciences</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Cold working, work hardening; annealing, quenching, tempering, recovery, and recrystallization; textures</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Heat treatment</subject><subject>Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)</subject><subject>Materials Science</subject><subject>Materials synthesis; materials processing</subject><subject>Metals. Metallurgy</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Nanocrystals</subject><subject>Optical and Electronic Materials</subject><subject>Physics</subject><subject>Production techniques</subject><subject>Rutile</subject><subject>Sol gel process</subject><subject>Spin coating</subject><subject>Thin films</subject><subject>Titanium dioxide</subject><subject>Treatment of materials and its effects on microstructure and properties</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp9kM1rGzEQxUVpoG7SP6C3JVCayyYz-tiVjibkCww5JIHcxFjWxjJrrSutD85fHxmHFArNYZjD_N5j3mPsJ8I5ArQXGUErWQNCGa5q_YVNULWilpo_f2UTMKqtpeL8G_ue8woAGin0hE0fdnFc-hxyRXFRuSUlcqNP4ZXGMMRq6KpIcXBpl0fq-xB99RjueTUuQ6y60K_zCTvqqM_-x_s-Zk_XV4-Xt_Xs_ubucjqrnZAw1oJDq8gt0HecyHDp0PE5KiEWnW5AtkRNS63rAOcoPJk5Gq45zsGUZOjFMft98N2k4c_W59GuQ3a-7yn6YZutNg1HLUAU8uxTEhvDhWzKRwU9_QddDdsUSw6rpRHYCq0LhAfIpSHn5Du7SWFNaWcR7L59e2jflvbtvn271_x6N6bsqO8SRRfyh5AL3aBSpnD8wOVyii8-_X3g_-ZvUR6SkQ</recordid><startdate>20110301</startdate><enddate>20110301</enddate><creator>Pawar, S. G.</creator><creator>Patil, S. L.</creator><creator>Chougule, M. A.</creator><creator>Jundale, D. M.</creator><creator>Patil, V. B.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><scope>7QQ</scope></search><sort><creationdate>20110301</creationdate><title>Synthesis and characterization of nanocrystalline TiO2 thin films</title><author>Pawar, S. G. ; Patil, S. L. ; Chougule, M. A. ; Jundale, D. M. ; Patil, V. B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Annealing</topic><topic>Applied sciences</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Cold working, work hardening; annealing, quenching, tempering, recovery, and recrystallization; textures</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Heat treatment</topic><topic>Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)</topic><topic>Materials Science</topic><topic>Materials synthesis; materials processing</topic><topic>Metals. Metallurgy</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Nanocrystals</topic><topic>Optical and Electronic Materials</topic><topic>Physics</topic><topic>Production techniques</topic><topic>Rutile</topic><topic>Sol gel process</topic><topic>Spin coating</topic><topic>Thin films</topic><topic>Titanium dioxide</topic><topic>Treatment of materials and its effects on microstructure and properties</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pawar, S. G.</creatorcontrib><creatorcontrib>Patil, S. L.</creatorcontrib><creatorcontrib>Chougule, M. A.</creatorcontrib><creatorcontrib>Jundale, D. M.</creatorcontrib><creatorcontrib>Patil, V. B.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><collection>Ceramic Abstracts</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pawar, S. G.</au><au>Patil, S. L.</au><au>Chougule, M. A.</au><au>Jundale, D. M.</au><au>Patil, V. B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Synthesis and characterization of nanocrystalline TiO2 thin films</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2011-03-01</date><risdate>2011</risdate><volume>22</volume><issue>3</issue><spage>260</spage><epage>264</epage><pages>260-264</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Nanocrystalline thin films of TiO
2
have been synthesized by sol gel spin coating technique Thin films of TiO
2
annealed at 700 °C were characterized by X-ray diffraction(XRD), Atomic Force Microscopy, High resolution TEM and Scanning Electron Microscopy (SEM), The XRD shows formation of tetragonal anatase and rutile phases with lattice parameters
a
= 3.7837 Å and
c
= 9.5087 Å. The surface morphology of the TiO
2
films showed that the nanoparticles are fine with an average grain size of about 60 nm. Optical studies revealed a high absorption coefficient (10
4
cm
−1
) with a direct band gap of 3.24 eV. The films are of the
n
type conduction with room temperature electrical conductivity of 10
−6
(Ω cm)
−1
.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s10854-010-0125-8</doi><tpages>5</tpages></addata></record> |
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| ispartof | Journal of materials science. Materials in electronics, 2011-03, Vol.22 (3), p.260-264 |
| issn | 0957-4522 1573-482X |
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| source | Springer Nature |
| subjects | Annealing Applied sciences Characterization and Evaluation of Materials Chemistry and Materials Science Cold working, work hardening annealing, quenching, tempering, recovery, and recrystallization textures Cross-disciplinary physics: materials science rheology Electronics Exact sciences and technology Heat treatment Liquid phase epitaxy deposition from liquid phases (melts, solutions, and surface layers on liquids) Materials Science Materials synthesis materials processing Metals. Metallurgy Methods of deposition of films and coatings film growth and epitaxy Nanocrystals Optical and Electronic Materials Physics Production techniques Rutile Sol gel process Spin coating Thin films Titanium dioxide Treatment of materials and its effects on microstructure and properties |
| title | Synthesis and characterization of nanocrystalline TiO2 thin films |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T04%3A11%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Synthesis%20and%20characterization%20of%20nanocrystalline%20TiO2%20thin%20films&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Pawar,%20S.%20G.&rft.date=2011-03-01&rft.volume=22&rft.issue=3&rft.spage=260&rft.epage=264&rft.pages=260-264&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-010-0125-8&rft_dat=%3Cproquest_cross%3E2258239081%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c340t-32075acd1ef2aa924c1c2b1533df86047aa67a7cf01b13ea9b192821b090851e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=849317388&rft_id=info:pmid/&rfr_iscdi=true |