Integrity-based self-validation test scheduling

Intelligent sensors use functional self-testing to confirm measurement validity; this introduces the potential for false diagnosis and unnecessary corrective intervention. For a sensor in an integrity-monitoring context, it is desirable to select a test-interval to minimize the probability of faulty...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on reliability 2003-06, Vol.52 (2), p.162-167
Main Author: Fry, A.J.
Format: Article
Language:English
Subjects:
Accounting
Automatic testing
Built-in self-test
Constraining
Cost function
Diagnosis
Fault detection
Guidelines
Intelligent sensors
Intervals
Job shop scheduling
Optimization
Protection
Safety
Scheduling
Sensors
System testing
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Intelligent sensors use functional self-testing to confirm measurement validity; this introduces the potential for false diagnosis and unnecessary corrective intervention. For a sensor in an integrity-monitoring context, it is desirable to select a test-interval to minimize the probability of faulty operation between discrete tests. The scheduling of discrete test intervals is examined as an optimization problem under a reliability-based cost-function. A convenient test-interval guideline, accounting for the operating context of the sensor, is derived for a simple case under limiting assumptions.
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.2003.813154