Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry

In secondary ion mass spectrometry (SIMS) of organic substances, the dissociation of the sample molecules is crucial. We have developed SIMS equipment capable of bombardment, where the primary ions are argon cluster ions with kinetic energy per atom controllable down to 1 eV. We previously reported...

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Bibliographic Details
Published in:Rapid communications in mass spectrometry 2011-04, Vol.25 (8), p.1070-1074
Main Authors: Oshima, Shohei, Kashihara, Ippei, Moritani, Kousuke, Inui, Norio, Mochiji, Kozo
Format: Article
Language:English
Subjects:
Argon
Argon - chemistry
Clusters
Emission
Focusing
Fragmentation
Humans
Insulin
Insulin - chemistry
Ions - chemistry
Kinetic energy
Mass Spectrometry - methods
Secondary ion mass spectrometry
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Summary:In secondary ion mass spectrometry (SIMS) of organic substances, the dissociation of the sample molecules is crucial. We have developed SIMS equipment capable of bombardment, where the primary ions are argon cluster ions with kinetic energy per atom controllable down to 1 eV. We previously reported the detection of intact ions of insulin and cytochrome C using this equipment. In this paper, we present a detailed characterization of the emission of secondary ions from insulin, focusing on the difference in secondary ion yield between intact ions and fragment ions by varying the incident angle of the cluster ions. The emission intensity of the intact ions was changed drastically due to the exposed dosage and incident angle of the cluster ions in contrast to the fragment ions. We discuss these results based on the manner in which the argon‐cluster ions collide with the organic solid. Copyright © 2011 John Wiley & Sons, Ltd.
ISSN:0951-4198
1097-0231
1097-0231
DOI:10.1002/rcm.4959