Object location and centroiding techniques with CMOS active pixel sensors

A system based on a pixel-parallel CMOS active pixel sensor architecture is demonstrated for capturing the location and approximate size of an object. The object is distinguished from the background by a global threshold. Three prototype sensors are implemented in standard CMOS technologies. In the...

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Bibliographic Details
Published in:IEEE transactions on electron devices 2003-12, Vol.50 (12), p.2369-2377, Article 2369
Main Authors: Burns, R.D., Shah, J., Canaan Hong, Pepic, S., Ji Soo Lee, Homsey, R.I., Thomas, P.
Format: Article
Language:English
Subjects:
Active pixel sensors
Architecture
CMOS
Comparators
Devices
Image registration
Integrated circuit noise
Object detection
Position (location)
Sensors
Thresholds
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Summary:A system based on a pixel-parallel CMOS active pixel sensor architecture is demonstrated for capturing the location and approximate size of an object. The object is distinguished from the background by a global threshold. Three prototype sensors are implemented in standard CMOS technologies. In the first, a high fill factor three-transistor pixel with integral comparator is demonstrated. It is shown that performance of this sensor is limited by device nonuniformities, so a novel in-pixel fixed-pattern noise correction circuit using a single capacitor is demonstrated in the second sensor. The system concept is further enhanced by a cumulative cross section readout architecture which provides additional information regarding the object with little reduction in speed. The application of these systems to centroid determination using multiple thresholds is discussed.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2003.819260