Measurement of the linewidth enhancement factor of semiconductor lasers based on the optical feedback self-mixing effect

A new method for the measurement of the linewidth enhancement factor of semiconductor lasers is presented, based on the interferometric self-mixing effect. It is a fast and easy to perform method that does not require radio frequency nor optical spectrum measurements. A small fraction of the emitted...

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Bibliographic Details
Published in:IEEE photonics technology letters 2004-04, Vol.16 (4), p.990-992
Main Authors: Yanguang Yu, Giuliani, G., Donati, S.
Format: Article
Language:English
Subjects:
Emittance
Intervals
Laser cavities
Laser feedback
Lasing
Modulation
Optical feedback
Optical interferometry
Optical mixing
Optical modulation
Performance evaluation
Power generation
Radio interferometry
Semiconductor lasers
Stimulated emission
Waveforms
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Summary:A new method for the measurement of the linewidth enhancement factor of semiconductor lasers is presented, based on the interferometric self-mixing effect. It is a fast and easy to perform method that does not require radio frequency nor optical spectrum measurements. A small fraction of the emitted light is backreflected into the laser cavity by a remote target driven by a sine waveform. The mixing of the returned and the lasing fields generates a modulation of the optical output power in the form of an interferometric waveform, with a shape that depends on the optical feedback strength and the linewidth enhancement factor /spl alpha/, according to the well-known Lang-Kobayashi theory. We show that the value of /spl alpha/ can be retrieved from a simple measurement of two characteristic time intervals of the interferometric waveform. Experimental results obtained on different laser diodes show an accuracy of /spl plusmn/6.5%.
ISSN:1041-1135
1941-0174
DOI:10.1109/LPT.2004.824631