Microstructure and magnetic properties of CoFe2O4 thin films deposited on Si substrates with an Fe3O4 under-layer

The microstructure and magnetic properties of cobalt ferrite thin films deposited by the sputtering method on an Fe3o4 un- der-layer were investigated at different post-annealing temperatures. Results show that the Fe3o4 under-layer can accelerate the grain growth of cobalt ferrite films due to the...

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Bibliographic Details
Published in:Science China. Physics, mechanics & astronomy mechanics & astronomy, 2011-07, Vol.54 (7), p.1235-1238
Main Authors: Zhong, ZhiYong, Zhang, HuaiWu, Tang, XiaoLi, Jing, YuLan, Bai, FeiMing, Liu, Shuang
Format: Article
Language:English
Subjects:
Annealing
Astronomy
Classical and Continuum Physics
Cobalt
Cobalt ferrites
Coercivity
CoFe2O4
Fe3O4
Grain growth
Iron oxides
Magnetic properties
Microstructure
Observations and Techniques
Phase transitions
Physics
Physics and Astronomy
Research Paper
Silicon substrates
Si衬底
Thin films
微观结构
沉积
磁学性质
钴铁氧体
铁氧体薄膜
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Summary:The microstructure and magnetic properties of cobalt ferrite thin films deposited by the sputtering method on an Fe3o4 un- der-layer were investigated at different post-annealing temperatures. Results show that the Fe3o4 under-layer can accelerate the grain growth of cobalt ferrite films due to the phase transformation of the Fe3o4 under-layer at about 400℃-500℃. By intro- ducing the Fe3O4 under-layer, cobalt ferrite nanocrystalline thin films with high coercivity can be obtained at lower post-annealing temperatures.
ISSN:1674-7348
1869-1927
DOI:10.1007/s11433-011-4366-1