The use of electron paramagnetic resonance in the probing of the nano-dielectric interface

Electron paramagnetic resonance (EPR) has been used to study the properties of trapped electrons or holes in XLPE and in 12.5% vinylsilane-treated SiO 2 nano-particles in XLPE specimens. Both electrically unstressed and electrically stressed (up to 25 kV/mm) specimens were used. The EPR spectra of b...

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Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation 2008-02, Vol.15 (1), p.197-204
Main Authors: MacCrone, R.K., Nelson, J.K., Smith, R.C., Schadler, L.S.
Format: Article
Language:English
Subjects:
Charge carrier processes
Dielectrics
Electrical insulation
Electromagnetic wave absorption
Electron paramagnetic resonance
Electron traps
Impurities
Magnetic fields
Nanocomposites
Nanomaterials
Nanoparticles
Nanostructure
Paramagnetic materials
Paramagnetic resonance
Polymers
Radicals
Spectra
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Summary:Electron paramagnetic resonance (EPR) has been used to study the properties of trapped electrons or holes in XLPE and in 12.5% vinylsilane-treated SiO 2 nano-particles in XLPE specimens. Both electrically unstressed and electrically stressed (up to 25 kV/mm) specimens were used. The EPR spectra of both materials indicated that the acceptors/donors were oxygen radicals in the polymer, probably originating during the cross-linking. It was found that the anisotropic oxygen environments were not randomly oriented, but were textured, presumably during the fabrication of the sheet specimens. It was found that under the action of an applied electric field, the population of an additional number of oxygen radicals occurred. This result is discussed in relation to the implied polymer structure and conductivity mechanisms.
ISSN:1070-9878
1558-4135
DOI:10.1109/T-DEI.2008.4446751