Determination of the step response function of a dielectric in the presence of noise

In the time domain characterization of dielectrics a fundamental measure is the dielectric response function /spl Phi/(t). This function permits the relaxation time and the complex permittivity of the dielectric under test to be determined, allowing the complete characterization of the dielectric pr...

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Bibliographic Details
Published in:IEEE transactions on dielectrics and electrical insulation 2003-06, Vol.10 (3), p.369-374
Main Authors: Letosa, J., Garcia-Gracia, M., Artacho, J.M., Fornies-Marquina, J.M.
Format: Article
Language:English
Subjects:
Algorithms
Bandwidth
Deconvolution
Dielectric measurements
Dielectric properties
Dielectric relaxation
Dielectrics
Digital filters
Electrical insulation
Frequency
Mathematical analysis
Permittivity
Reflection
Reflectometry
Step response
Time domain
Time measurement
Voltage
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Summary:In the time domain characterization of dielectrics a fundamental measure is the dielectric response function /spl Phi/(t). This function permits the relaxation time and the complex permittivity of the dielectric under test to be determined, allowing the complete characterization of the dielectric properties. To calculate the /spl Phi/(t) function a time domain deconvolution algorithm (TDD), developed in a previous work, is employed. In this paper a new technique to enhance the calculation of the /spl Phi/(t) function in the time domain, is presented, avoiding the instability problems inherent to the TDD algorithm. The method consists in the use of appropriate digital lowpass filter in several stages of the time domain deconvolution algorithm to calculate the /spl Phi/(t) function. This procedure provides an enhanced precision for /spl Phi/(t) even for very short times (/spl ap/ 10 ps for the time domain reflectometry system used).
ISSN:1070-9878
1558-4135
DOI:10.1109/TDEI.2003.1207458