Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass

In this work, we have prepared copper‐doped multicomponent tellurite glasses by solid state electric field‐assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc‐...

Full description

Saved in:
Bibliographic Details
Published in:Journal of the American Ceramic Society 2011-07, Vol.94 (7), p.1986-1988
Main Authors: Stepanov, Boris, Ren, Jing, Wagner, Tomas, Lorincik, Jan, Frumar, Miroslav, Churbanov, Mikhail, Chigirinsky, Yuri
Format: Article
Language:English
Subjects:
CERAMICS
Copper
DIFFUSION
Electric fields
Glass
GLASSES
Law
Planar waveguides
Secondary ion mass spectrometry
Solid state
SOLID STATE PHYSICS
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3
cites cdi_FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3
container_end_page 1988
container_issue 7
container_start_page 1986
container_title Journal of the American Ceramic Society
container_volume 94
creator Stepanov, Boris
Ren, Jing
Wagner, Tomas
Lorincik, Jan
Frumar, Miroslav
Churbanov, Mikhail
Chigirinsky, Yuri
description In this work, we have prepared copper‐doped multicomponent tellurite glasses by solid state electric field‐assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc‐like solution of the second Fick's law which assumes that both the Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabricating copper‐doped planar waveguides based on the tellurite glasses.
doi_str_mv 10.1111/j.1551-2916.2011.04606.x
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_914620253</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>914620253</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3</originalsourceid><addsrcrecordid>eNqNkU9v1DAQxS0EEkvhO1hc4JLgcfwvF6QlbRdQAUFLOVpOYktesnGwE7H99jgs6oEDwhd75Pd-mpmHEAZSQj6v9iVwDgWtQZSUAJSECSLK4wO0uf94iDaEEFpIRclj9CSlfS6hVmyDPl-Hwff4ejazxZfeDn2xTcmn2fb43Du3JB9GHBxuwjTZiP2IPyzD7IsmHKYw2nHGN3YYluizfzeYlJ6iR84MyT77c5-hr5cXN83b4urT7l2zvSo6xpgoatYqaUDKGrgB4J3pe656ZXsCpq0M1B1TnaudFFQZIJIT1-b5WqeMsratztCLE3eK4cdi06wPPnW5FzPasCRdAxOUUF5l5ct_KkFIqDiVgmTp87-k-7DEMc-hlWJQSV6vPHUSdTGkFK3TU_QHE-80EL2Govd63b1ed6_XUPTvUPQxW1-frD_9YO_-26ffb5uL9ZkBxQmwRnS8B5j4XQuZ29PfPu60_HJ-e1tJqt9UvwBQXqBa</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884137593</pqid></control><display><type>article</type><title>Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass</title><source>Wiley-Blackwell Read &amp; Publish Collection</source><creator>Stepanov, Boris ; Ren, Jing ; Wagner, Tomas ; Lorincik, Jan ; Frumar, Miroslav ; Churbanov, Mikhail ; Chigirinsky, Yuri</creator><creatorcontrib>Stepanov, Boris ; Ren, Jing ; Wagner, Tomas ; Lorincik, Jan ; Frumar, Miroslav ; Churbanov, Mikhail ; Chigirinsky, Yuri</creatorcontrib><description>In this work, we have prepared copper‐doped multicomponent tellurite glasses by solid state electric field‐assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc‐like solution of the second Fick's law which assumes that both the Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabricating copper‐doped planar waveguides based on the tellurite glasses.</description><identifier>ISSN: 0002-7820</identifier><identifier>EISSN: 1551-2916</identifier><identifier>DOI: 10.1111/j.1551-2916.2011.04606.x</identifier><identifier>CODEN: JACTAW</identifier><language>eng</language><publisher>Columbus: Blackwell Publishing Ltd</publisher><subject>CERAMICS ; Copper ; DIFFUSION ; Electric fields ; Glass ; GLASSES ; Law ; Planar waveguides ; Secondary ion mass spectrometry ; Solid state ; SOLID STATE PHYSICS</subject><ispartof>Journal of the American Ceramic Society, 2011-07, Vol.94 (7), p.1986-1988</ispartof><rights>2011 The American Ceramic Society</rights><rights>Copyright American Ceramic Society Jul 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3</citedby><cites>FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Stepanov, Boris</creatorcontrib><creatorcontrib>Ren, Jing</creatorcontrib><creatorcontrib>Wagner, Tomas</creatorcontrib><creatorcontrib>Lorincik, Jan</creatorcontrib><creatorcontrib>Frumar, Miroslav</creatorcontrib><creatorcontrib>Churbanov, Mikhail</creatorcontrib><creatorcontrib>Chigirinsky, Yuri</creatorcontrib><title>Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass</title><title>Journal of the American Ceramic Society</title><addtitle>J. Am. Ceram. Soc</addtitle><description>In this work, we have prepared copper‐doped multicomponent tellurite glasses by solid state electric field‐assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc‐like solution of the second Fick's law which assumes that both the Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabricating copper‐doped planar waveguides based on the tellurite glasses.</description><subject>CERAMICS</subject><subject>Copper</subject><subject>DIFFUSION</subject><subject>Electric fields</subject><subject>Glass</subject><subject>GLASSES</subject><subject>Law</subject><subject>Planar waveguides</subject><subject>Secondary ion mass spectrometry</subject><subject>Solid state</subject><subject>SOLID STATE PHYSICS</subject><issn>0002-7820</issn><issn>1551-2916</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqNkU9v1DAQxS0EEkvhO1hc4JLgcfwvF6QlbRdQAUFLOVpOYktesnGwE7H99jgs6oEDwhd75Pd-mpmHEAZSQj6v9iVwDgWtQZSUAJSECSLK4wO0uf94iDaEEFpIRclj9CSlfS6hVmyDPl-Hwff4ejazxZfeDn2xTcmn2fb43Du3JB9GHBxuwjTZiP2IPyzD7IsmHKYw2nHGN3YYluizfzeYlJ6iR84MyT77c5-hr5cXN83b4urT7l2zvSo6xpgoatYqaUDKGrgB4J3pe656ZXsCpq0M1B1TnaudFFQZIJIT1-b5WqeMsratztCLE3eK4cdi06wPPnW5FzPasCRdAxOUUF5l5ct_KkFIqDiVgmTp87-k-7DEMc-hlWJQSV6vPHUSdTGkFK3TU_QHE-80EL2Govd63b1ed6_XUPTvUPQxW1-frD_9YO_-26ffb5uL9ZkBxQmwRnS8B5j4XQuZ29PfPu60_HJ-e1tJqt9UvwBQXqBa</recordid><startdate>201107</startdate><enddate>201107</enddate><creator>Stepanov, Boris</creator><creator>Ren, Jing</creator><creator>Wagner, Tomas</creator><creator>Lorincik, Jan</creator><creator>Frumar, Miroslav</creator><creator>Churbanov, Mikhail</creator><creator>Chigirinsky, Yuri</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><scope>H8G</scope></search><sort><creationdate>201107</creationdate><title>Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass</title><author>Stepanov, Boris ; Ren, Jing ; Wagner, Tomas ; Lorincik, Jan ; Frumar, Miroslav ; Churbanov, Mikhail ; Chigirinsky, Yuri</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CERAMICS</topic><topic>Copper</topic><topic>DIFFUSION</topic><topic>Electric fields</topic><topic>Glass</topic><topic>GLASSES</topic><topic>Law</topic><topic>Planar waveguides</topic><topic>Secondary ion mass spectrometry</topic><topic>Solid state</topic><topic>SOLID STATE PHYSICS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Stepanov, Boris</creatorcontrib><creatorcontrib>Ren, Jing</creatorcontrib><creatorcontrib>Wagner, Tomas</creatorcontrib><creatorcontrib>Lorincik, Jan</creatorcontrib><creatorcontrib>Frumar, Miroslav</creatorcontrib><creatorcontrib>Churbanov, Mikhail</creatorcontrib><creatorcontrib>Chigirinsky, Yuri</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Copper Technical Reference Library</collection><jtitle>Journal of the American Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Stepanov, Boris</au><au>Ren, Jing</au><au>Wagner, Tomas</au><au>Lorincik, Jan</au><au>Frumar, Miroslav</au><au>Churbanov, Mikhail</au><au>Chigirinsky, Yuri</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass</atitle><jtitle>Journal of the American Ceramic Society</jtitle><addtitle>J. Am. Ceram. Soc</addtitle><date>2011-07</date><risdate>2011</risdate><volume>94</volume><issue>7</issue><spage>1986</spage><epage>1988</epage><pages>1986-1988</pages><issn>0002-7820</issn><eissn>1551-2916</eissn><coden>JACTAW</coden><abstract>In this work, we have prepared copper‐doped multicomponent tellurite glasses by solid state electric field‐assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc‐like solution of the second Fick's law which assumes that both the Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabricating copper‐doped planar waveguides based on the tellurite glasses.</abstract><cop>Columbus</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1111/j.1551-2916.2011.04606.x</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0002-7820
ispartof Journal of the American Ceramic Society, 2011-07, Vol.94 (7), p.1986-1988
issn 0002-7820
1551-2916
language eng
recordid cdi_proquest_miscellaneous_914620253
source Wiley-Blackwell Read & Publish Collection
subjects CERAMICS
Copper
DIFFUSION
Electric fields
Glass
GLASSES
Law
Planar waveguides
Secondary ion mass spectrometry
Solid state
SOLID STATE PHYSICS
title Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T19%3A15%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Solid%20State%20Field-Assisted%20Diffusion%20of%20Copper%20in%20Multi-Component%20Tellurite%20Glass&rft.jtitle=Journal%20of%20the%20American%20Ceramic%20Society&rft.au=Stepanov,%20Boris&rft.date=2011-07&rft.volume=94&rft.issue=7&rft.spage=1986&rft.epage=1988&rft.pages=1986-1988&rft.issn=0002-7820&rft.eissn=1551-2916&rft.coden=JACTAW&rft_id=info:doi/10.1111/j.1551-2916.2011.04606.x&rft_dat=%3Cproquest_cross%3E914620253%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c4446-94b87a177915a115cadd58d8ed01ab3a19c48cf9f7628a10750fb011bf8a8eeb3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=884137593&rft_id=info:pmid/&rfr_iscdi=true