Loading…
Critical Current Degradation of Bi-2223 Composite Tapes Induced byCyclic Deformation and Fatigue-Related Effects
Application of high temperature superconductor Bi 2 Sr 2 Ca 2 Cu 3 O x (Bi-2223) compound embedded in an Ag matrix requires the knowledge of critical current as a function of mechanical properties. Commercial tapes available in different types have been developed in industrial production scale in wh...
Saved in:
Published in: | IEEE transactions on applied superconductivity 2006-06, Vol.16 (2), p.1027-1030 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3 |
---|---|
cites | cdi_FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3 |
container_end_page | 1030 |
container_issue | 2 |
container_start_page | 1027 |
container_title | IEEE transactions on applied superconductivity |
container_volume | 16 |
creator | Shigue, C.Y. Baldan, C.A. Oliveira, U.R. Carvalho, F.J.H. Filho, E.R. |
description | Application of high temperature superconductor Bi 2 Sr 2 Ca 2 Cu 3 O x (Bi-2223) compound embedded in an Ag matrix requires the knowledge of critical current as a function of mechanical properties. Commercial tapes available in different types have been developed in industrial production scale in which a combination of small diameter filaments, long tape lengths and a ductile matrix results in a conductor with low crack formation and good tolerance against strain. The measurement of critical current and the evaluation of n-index from V-I characteristic curves of Bi-2223/Ag composite tapes subjected to an initial bending strain as a function of number of thermal cycles were done for two types of Bi-2223/Ag composite tapes: with and without steel tape reinforcement. The results showed that tapes with reinforcement presented small critical current degradation as a function of the number of thermal cycles whereas tapes without reinforcement exhibited steadily critical current degradation caused by the propagation of cracks. The n-index followed the same critical current behavior |
doi_str_mv | 10.1109/TASC.2006.876585 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_914658957</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1643023</ieee_id><sourcerecordid>914658957</sourcerecordid><originalsourceid>FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3</originalsourceid><addsrcrecordid>eNpdkUFr3DAQRk1poGmae6AXUSg5eTuSJVk6bpxNGwgEks3ZKPIoaPFajmQf9t9HiwMLPWmQ3htG8xXFFYUVpaD_bNfPzYoByJWqpVDiS3FOhVAlE1R8zTUIWirGqm_F95R2AJQrLs6LsYl-8tb0pJljxGEit_gWTWcmHwYSHLnxJcsaacJ-DMlPSLZmxETuh2622JHXQ3OwvbfZcyHuF88MHbnL5duM5RP2Zsrgxjm0U_pRnDnTJ7z8PC-Kl7vNtvlXPjz-vW_WD6Vlsp5KxVnF8_zIqkoLza0xnWOSOwmgOIBFBOXyvWBI0VKw1FnVScO47tBidVFcL33HGN5nTFO798li35sBw5xaTXlekxZ1Jn_9R-7CHIc8XIYYg1pIkSFYIBtDShFdO0a_N_HQUmiPAbTHANpjAO0SQFZ-f_Y1KS_YRTNYn05erbmWGjL3c-E8Ip6eJa8gf_4DXKmNhg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912207565</pqid></control><display><type>article</type><title>Critical Current Degradation of Bi-2223 Composite Tapes Induced byCyclic Deformation and Fatigue-Related Effects</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Shigue, C.Y. ; Baldan, C.A. ; Oliveira, U.R. ; Carvalho, F.J.H. ; Filho, E.R.</creator><creatorcontrib>Shigue, C.Y. ; Baldan, C.A. ; Oliveira, U.R. ; Carvalho, F.J.H. ; Filho, E.R.</creatorcontrib><description>Application of high temperature superconductor Bi 2 Sr 2 Ca 2 Cu 3 O x (Bi-2223) compound embedded in an Ag matrix requires the knowledge of critical current as a function of mechanical properties. Commercial tapes available in different types have been developed in industrial production scale in which a combination of small diameter filaments, long tape lengths and a ductile matrix results in a conductor with low crack formation and good tolerance against strain. The measurement of critical current and the evaluation of n-index from V-I characteristic curves of Bi-2223/Ag composite tapes subjected to an initial bending strain as a function of number of thermal cycles were done for two types of Bi-2223/Ag composite tapes: with and without steel tape reinforcement. The results showed that tapes with reinforcement presented small critical current degradation as a function of the number of thermal cycles whereas tapes without reinforcement exhibited steadily critical current degradation caused by the propagation of cracks. The n-index followed the same critical current behavior</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2006.876585</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Bending strain ; Bi-2223 tapes ; Bismuth ; Capacitive sensors ; COMPOSITES ; Conductors ; CRACKS ; Critical current ; Critical current (superconductivity) ; DEFORMATION ; Degradation ; Electrical engineering. Electrical power engineering ; Electronics ; Exact sciences and technology ; fatigue ; FATIGUE PROPERTIES ; Filaments ; High temperature superconductors ; INDUSTRIAL APPLICATIONS ; Materials ; Mechanical factors ; Production ; REINFORCEMENT ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Silver ; STRAIN ; Strain measurement ; Strontium ; Studies ; Superconducting devices ; Superconducting tapes ; SUPERCONDUCTORS ; TAPE ; Thermal degradation ; thermal shock</subject><ispartof>IEEE transactions on applied superconductivity, 2006-06, Vol.16 (2), p.1027-1030</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3</citedby><cites>FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1643023$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17949690$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Shigue, C.Y.</creatorcontrib><creatorcontrib>Baldan, C.A.</creatorcontrib><creatorcontrib>Oliveira, U.R.</creatorcontrib><creatorcontrib>Carvalho, F.J.H.</creatorcontrib><creatorcontrib>Filho, E.R.</creatorcontrib><title>Critical Current Degradation of Bi-2223 Composite Tapes Induced byCyclic Deformation and Fatigue-Related Effects</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>Application of high temperature superconductor Bi 2 Sr 2 Ca 2 Cu 3 O x (Bi-2223) compound embedded in an Ag matrix requires the knowledge of critical current as a function of mechanical properties. Commercial tapes available in different types have been developed in industrial production scale in which a combination of small diameter filaments, long tape lengths and a ductile matrix results in a conductor with low crack formation and good tolerance against strain. The measurement of critical current and the evaluation of n-index from V-I characteristic curves of Bi-2223/Ag composite tapes subjected to an initial bending strain as a function of number of thermal cycles were done for two types of Bi-2223/Ag composite tapes: with and without steel tape reinforcement. The results showed that tapes with reinforcement presented small critical current degradation as a function of the number of thermal cycles whereas tapes without reinforcement exhibited steadily critical current degradation caused by the propagation of cracks. The n-index followed the same critical current behavior</description><subject>Applied sciences</subject><subject>Bending strain</subject><subject>Bi-2223 tapes</subject><subject>Bismuth</subject><subject>Capacitive sensors</subject><subject>COMPOSITES</subject><subject>Conductors</subject><subject>CRACKS</subject><subject>Critical current</subject><subject>Critical current (superconductivity)</subject><subject>DEFORMATION</subject><subject>Degradation</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>fatigue</subject><subject>FATIGUE PROPERTIES</subject><subject>Filaments</subject><subject>High temperature superconductors</subject><subject>INDUSTRIAL APPLICATIONS</subject><subject>Materials</subject><subject>Mechanical factors</subject><subject>Production</subject><subject>REINFORCEMENT</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Silver</subject><subject>STRAIN</subject><subject>Strain measurement</subject><subject>Strontium</subject><subject>Studies</subject><subject>Superconducting devices</subject><subject>Superconducting tapes</subject><subject>SUPERCONDUCTORS</subject><subject>TAPE</subject><subject>Thermal degradation</subject><subject>thermal shock</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNpdkUFr3DAQRk1poGmae6AXUSg5eTuSJVk6bpxNGwgEks3ZKPIoaPFajmQf9t9HiwMLPWmQ3htG8xXFFYUVpaD_bNfPzYoByJWqpVDiS3FOhVAlE1R8zTUIWirGqm_F95R2AJQrLs6LsYl-8tb0pJljxGEit_gWTWcmHwYSHLnxJcsaacJ-DMlPSLZmxETuh2622JHXQ3OwvbfZcyHuF88MHbnL5duM5RP2Zsrgxjm0U_pRnDnTJ7z8PC-Kl7vNtvlXPjz-vW_WD6Vlsp5KxVnF8_zIqkoLza0xnWOSOwmgOIBFBOXyvWBI0VKw1FnVScO47tBidVFcL33HGN5nTFO798li35sBw5xaTXlekxZ1Jn_9R-7CHIc8XIYYg1pIkSFYIBtDShFdO0a_N_HQUmiPAbTHANpjAO0SQFZ-f_Y1KS_YRTNYn05erbmWGjL3c-E8Ip6eJa8gf_4DXKmNhg</recordid><startdate>200606</startdate><enddate>200606</enddate><creator>Shigue, C.Y.</creator><creator>Baldan, C.A.</creator><creator>Oliveira, U.R.</creator><creator>Carvalho, F.J.H.</creator><creator>Filho, E.R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>H8G</scope><scope>JG9</scope></search><sort><creationdate>200606</creationdate><title>Critical Current Degradation of Bi-2223 Composite Tapes Induced byCyclic Deformation and Fatigue-Related Effects</title><author>Shigue, C.Y. ; Baldan, C.A. ; Oliveira, U.R. ; Carvalho, F.J.H. ; Filho, E.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Applied sciences</topic><topic>Bending strain</topic><topic>Bi-2223 tapes</topic><topic>Bismuth</topic><topic>Capacitive sensors</topic><topic>COMPOSITES</topic><topic>Conductors</topic><topic>CRACKS</topic><topic>Critical current</topic><topic>Critical current (superconductivity)</topic><topic>DEFORMATION</topic><topic>Degradation</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>fatigue</topic><topic>FATIGUE PROPERTIES</topic><topic>Filaments</topic><topic>High temperature superconductors</topic><topic>INDUSTRIAL APPLICATIONS</topic><topic>Materials</topic><topic>Mechanical factors</topic><topic>Production</topic><topic>REINFORCEMENT</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Silver</topic><topic>STRAIN</topic><topic>Strain measurement</topic><topic>Strontium</topic><topic>Studies</topic><topic>Superconducting devices</topic><topic>Superconducting tapes</topic><topic>SUPERCONDUCTORS</topic><topic>TAPE</topic><topic>Thermal degradation</topic><topic>thermal shock</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shigue, C.Y.</creatorcontrib><creatorcontrib>Baldan, C.A.</creatorcontrib><creatorcontrib>Oliveira, U.R.</creatorcontrib><creatorcontrib>Carvalho, F.J.H.</creatorcontrib><creatorcontrib>Filho, E.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEL</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shigue, C.Y.</au><au>Baldan, C.A.</au><au>Oliveira, U.R.</au><au>Carvalho, F.J.H.</au><au>Filho, E.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Critical Current Degradation of Bi-2223 Composite Tapes Induced byCyclic Deformation and Fatigue-Related Effects</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2006-06</date><risdate>2006</risdate><volume>16</volume><issue>2</issue><spage>1027</spage><epage>1030</epage><pages>1027-1030</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>Application of high temperature superconductor Bi 2 Sr 2 Ca 2 Cu 3 O x (Bi-2223) compound embedded in an Ag matrix requires the knowledge of critical current as a function of mechanical properties. Commercial tapes available in different types have been developed in industrial production scale in which a combination of small diameter filaments, long tape lengths and a ductile matrix results in a conductor with low crack formation and good tolerance against strain. The measurement of critical current and the evaluation of n-index from V-I characteristic curves of Bi-2223/Ag composite tapes subjected to an initial bending strain as a function of number of thermal cycles were done for two types of Bi-2223/Ag composite tapes: with and without steel tape reinforcement. The results showed that tapes with reinforcement presented small critical current degradation as a function of the number of thermal cycles whereas tapes without reinforcement exhibited steadily critical current degradation caused by the propagation of cracks. The n-index followed the same critical current behavior</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2006.876585</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1051-8223 |
ispartof | IEEE transactions on applied superconductivity, 2006-06, Vol.16 (2), p.1027-1030 |
issn | 1051-8223 1558-2515 |
language | eng |
recordid | cdi_proquest_miscellaneous_914658957 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Applied sciences Bending strain Bi-2223 tapes Bismuth Capacitive sensors COMPOSITES Conductors CRACKS Critical current Critical current (superconductivity) DEFORMATION Degradation Electrical engineering. Electrical power engineering Electronics Exact sciences and technology fatigue FATIGUE PROPERTIES Filaments High temperature superconductors INDUSTRIAL APPLICATIONS Materials Mechanical factors Production REINFORCEMENT Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silver STRAIN Strain measurement Strontium Studies Superconducting devices Superconducting tapes SUPERCONDUCTORS TAPE Thermal degradation thermal shock |
title | Critical Current Degradation of Bi-2223 Composite Tapes Induced byCyclic Deformation and Fatigue-Related Effects |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T20%3A59%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Critical%20Current%20Degradation%20of%20Bi-2223%20Composite%20Tapes%20Induced%20byCyclic%20Deformation%20and%20Fatigue-Related%20Effects&rft.jtitle=IEEE%20transactions%20on%20applied%20superconductivity&rft.au=Shigue,%20C.Y.&rft.date=2006-06&rft.volume=16&rft.issue=2&rft.spage=1027&rft.epage=1030&rft.pages=1027-1030&rft.issn=1051-8223&rft.eissn=1558-2515&rft.coden=ITASE9&rft_id=info:doi/10.1109/TASC.2006.876585&rft_dat=%3Cproquest_cross%3E914658957%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c267t-84234558e2339594caadf264f6008400cee08f94c52e1ec10c1fc8d6a249dece3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=912207565&rft_id=info:pmid/&rft_ieee_id=1643023&rfr_iscdi=true |