Crack formation in MLCCs depending on position with and without post-heat treatment

Issue Title: Special Issue: ICE-2005 International Conference on Electroceramics The crack formation behavior and mechanical properties, hardness (H), modulus (E), and fracture toughness (K ^sub IC^), at each plane of BaTiO^sub 3^ based multilayer ceramic capacitors (MLCCs) have been investigated an...

Full description

Saved in:
Bibliographic Details
Published in:Journal of electroceramics 2006-12, Vol.17 (2-4), p.381-385
Main Authors: KIM, Dong-Wook, KANG, Ji-Hun, PARK, Sang-Hyun, KIM, Hyeon-Cheol, JUNG, Yeon-Gil, PAIK, Ungyu
Format: Article
Language:English
Subjects:
Applied sciences
Barium titanates
Ceramics
Dielectric, amorphous and glass solid devices
Electrodes
Electronics
Exact sciences and technology
Fracture mechanics
Integrated circuits
Mechanical properties
Multilayers
Planes
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Issue Title: Special Issue: ICE-2005 International Conference on Electroceramics The crack formation behavior and mechanical properties, hardness (H), modulus (E), and fracture toughness (K ^sub IC^), at each plane of BaTiO^sub 3^ based multilayer ceramic capacitors (MLCCs) have been investigated and estimated using a nanoindentation technique, including effects of the post-heat treatment and the external electrode on the crack formation and mechanical properties. The crack length in each plane, length (x plane) and width (y plane) planes, has been measured for MLCCs with and without the post-heat treatment, as a function of the distance from the internal electrode. H and E values are 11.5-12.0 GPa and 175-190 GPa, respectively, independent of the plane and the post-heat treatment. The crack length in the x plane is smaller than that in the y plane, which is gradually increased as the indentation position is far away from the internal electrode. The external electrode affects the crack formation in regions near to the internal electrode, showing small crack length till 20 μm from the internal electrode. K ^sub IC^ values in the x plane are larger than those in the y plane. The external electrode affects only the K ^sub IC^ values in the x plane within the error range, without effect of the post-heat treatment.[PUBLICATION ABSTRACT]
ISSN:1385-3449
1573-8663
DOI:10.1007/s10832-006-9636-3