Dielectric particle and void resonators for thin film solar cell textures

Using Mie theory and Rigorous Coupled Wave Analysis (RCWA) we compare the properties of dielectric particle and void resonators. We show that void resonators-low refractive index inclusions within a high index embedding medium-exhibit larger bandwidth resonances, reduced peak scattering intensity, d...

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Bibliographic Details
Published in:Optics express 2011-12, Vol.19 (25), p.25729-25740
Main Authors: Mann, Sander A, Grote, Richard R, Osgood, Richard M, Schuller, Jon A
Format: Article
Language:English
Subjects:
Computer-Aided Design
Electric Power Supplies
Equipment Design
Equipment Failure Analysis
Nanoparticles - chemistry
Optical Devices
Refractometry
Solar Energy
Transducers
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Summary:Using Mie theory and Rigorous Coupled Wave Analysis (RCWA) we compare the properties of dielectric particle and void resonators. We show that void resonators-low refractive index inclusions within a high index embedding medium-exhibit larger bandwidth resonances, reduced peak scattering intensity, different polarization anisotropies, and enhanced forward scattering when compared to their particle (high index inclusions in a low index medium) counterparts. We evaluate amorphous silicon solar cell textures comprising either arrays of voids or particles. Both designs support substantial absorption enhancements (up to 45%) relative to a flat cell with anti-reflection coating, over a large range of cell thicknesses. By leveraging void-based textures 90% of above-bandgap photons are absorbed in cells with maximal vertical dimension of 100 nm.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.19.025729