Surface plasmon leakage radiation microscopy at the diffraction limit

This paper describes the image formation process in optical leakage radiation microscopy of surface plasmon-polaritons with diffraction limited spatial resolution. The comparison of experimentally recorded images with simulations of point-like surface plasmon-polariton emitters allows for an assignm...

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Bibliographic Details
Published in:Optics express 2011-12, Vol.19 (25), p.25749-25762
Main Authors: Hohenau, A, Krenn, J R, Drezet, A, Mollet, O, Huant, S, Genet, C, Stein, B, Ebbesen, T W
Format: Article
Language:English
Subjects:
Computer Simulation
Computer-Aided Design
Equipment Design
Equipment Failure Analysis
Image Enhancement - instrumentation
Light
Microscopy - instrumentation
Models, Theoretical
Radiation Dosage
Refractometry - instrumentation
Scattering, Radiation
Surface Plasmon Resonance - instrumentation
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Summary:This paper describes the image formation process in optical leakage radiation microscopy of surface plasmon-polaritons with diffraction limited spatial resolution. The comparison of experimentally recorded images with simulations of point-like surface plasmon-polariton emitters allows for an assignment of the observed fringe patterns. A simple formula for the prediction of the fringe periodicity is presented and practically relevant effects of abberations in the imaging system are discussed.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.19.025749