X-Ray Diffractometric Study and Electrophysical Properties of Phases in the CaTa2O6 - NdTa3O9 SYSTEM

The method of x-ray diffraction analysis is used for studying phase formation in the CaTa^sub 2^O^sub 6^ - NdTa^sub 3^O^sub 9^ system at up to 1400°C. It is shown that there exists a region of solid solutions of a rhombic crystal system based on NdTa^sub 3^O^sub 9^, the boundary of homogeneity of wh...

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Bibliographic Details
Published in:Refractories and industrial ceramics 2000-09, Vol.41 (9-10), p.313-315
Main Authors: Pivovarova, A P, Strakhov, V I, Smirnov, Yu N
Format: Article
Language:English
Subjects:
Boundaries
Dielectric constant
Diffraction
Homogeneity
Phases
Resistivity
Solid solutions
X-rays
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Summary:The method of x-ray diffraction analysis is used for studying phase formation in the CaTa^sub 2^O^sub 6^ - NdTa^sub 3^O^sub 9^ system at up to 1400°C. It is shown that there exists a region of solid solutions of a rhombic crystal system based on NdTa^sub 3^O^sub 9^, the boundary of homogeneity of which lies at up to 40 mol.% CaTa^sub 2^O^sub 6^. Specimens of the studied solid solutions possess an elevated dielectric constant (e 50 at room temperature). The temperature dependences of the electrical conductivity and the dielectric constants of the solid solutions in the range 20 - 450°C show that the polarization has a relaxation nature.[PUBLICATION ABSTRACT]
ISSN:1083-4877
1573-9139
DOI:10.1023/A:1011360418213