Hierarchical microstructures in CZT

Advanced characterization tools, such as electron backscatter diffraction and transmitted IR microscopy, are being applied to study critical microstructural features and orientation relations in as-grown CZT crystals to aid in understanding the relation between structure and properties in radiation...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2011-10, Vol.652 (1), p.174-177
Main Authors: Sundaram, S.K., Henager, C.H., Edwards, D.J., Schemer-Kohrn, A.L., Bliss, M., Riley, B.R., Toloczko, M.B., Lynn, K.G.
Format: Article
Language:English
Subjects:
CdZnTe
Crystal growth
CZT
Detectors
Dislocations
Electron backscatter diffraction
Hierarchical
Infrared microscopy
Microscopy
Microstructure
Microstructures
Networks
Radiation detectors
Spectrometers
Tellurium precipitate
Twin boundaries
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Summary:Advanced characterization tools, such as electron backscatter diffraction and transmitted IR microscopy, are being applied to study critical microstructural features and orientation relations in as-grown CZT crystals to aid in understanding the relation between structure and properties in radiation detectors. Even carefully prepared single crystals of CZT contain regions of slight misorientation, Te-particles, and dislocation networks that must be understood for more accurate models of detector response. This paper describes initial research at PNNL into the hierarchy of microstructures observed in CZT grown via the vertical gradient freeze or vertical Bridgman method at PNNL and WSU.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2010.09.128