Fault diagnosis technology based on Wigner-Ville distribution in power electronics circuit

Based on Wigner-Ville distribution similarity, a method of fault diagnosis is proposed for power electronics circuits. After setting up the module time-frequency matrices of Wigner-Ville distribution for all fault signals, the similarities between the module time-frequency matrices of the fault sign...

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Bibliographic Details
Published in:International journal of electronics 2011-09, Vol.98 (9), p.1247-1257
Main Authors: Rongjie, Wang, Yiju, Zhan, Meiqian, Chen, Haifeng, Zhou
Format: Article
Language:English
Subjects:
Applied sciences
Circuits
Diodes
Electric circuits
Electric currents
Electrical engineering. Electrical power engineering
Electronic circuits
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Fault diagnosis
Faults
Mathematical analysis
Matrices
Modules
Other multijunction devices. Power transistors. Thyristors
power electronics circuit
Power electronics, power supplies
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Similarity
Simulation
Testing, measurement, noise and reliability
Wigner-Ville distribution
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Summary:Based on Wigner-Ville distribution similarity, a method of fault diagnosis is proposed for power electronics circuits. After setting up the module time-frequency matrices of Wigner-Ville distribution for all fault signals, the similarities between the module time-frequency matrices of the fault signal and the former standard are then calculated, thus arriving at the diagnosis according to the principle of maximum similarity. The simulation result of fault diagnosis of a thyristor in a three-phase full-bridge-controlled rectifier shows that the method can accurately identify the fault types as well as the location of the fault elements for power electronics circuits, and it has an excellent performance for noise robustness and calculation complexity. Therefore, it is quite practically valuable in the solution to the fault problems for power electronics circuits.
ISSN:0020-7217
1362-3060
DOI:10.1080/00207217.2011.589738