Power cycling fatigue and lifetime prediction of power electronic devices in space applications

• Published in: Microelectronics and reliability 2011-09, Vol.51 (9-11), p.1985-1989
• Main Authors: Vacher, F., Calvet, B., Mialhe, F.
• Format: Article
• Language: English
• Subjects: Applied sciences; Automotive components; Automotive industry; Cycles; Electrical engineering. Electrical power engineering; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics; Electronics; Exact sciences and technology; Fatigue (materials); Fatigue failure; Power electronics, power supplies; Space applications; Stresses; Traction
• ISSN: 0026-2714; 1872-941X
• DOI: 10.1016/j.microrel.2011.06.013

► Description of the power cycling constraint in space application. ► Power cycling experiment on space transistors characterized by small power and high reliability. ► Influence of thermal excursion and current on the number of cycles to failure. ► Applicability of standard traction power cycling analysis to space transistors. ► Lifetime prediction for a typical space application. This paper presents a complete study about power cycling stress on space components. Power cycling fatigue is generally studied for traction or automotive applications. But power cycling failures are also a major cause of concern in space industry. In this paper we successively address the following subjects: definition of the power cycling stress in space applications, experimental power cycling test on space components and lifetime prediction for a typical earth observation application.