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Power cycling fatigue and lifetime prediction of power electronic devices in space applications
► Description of the power cycling constraint in space application. ► Power cycling experiment on space transistors characterized by small power and high reliability. ► Influence of thermal excursion and current on the number of cycles to failure. ► Applicability of standard traction power cycling a...
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| Published in: | Microelectronics and reliability 2011-09, Vol.51 (9-11), p.1985-1989 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
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| Online Access: | Get full text |
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| cited_by | cdi_FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873 |
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| cites | cdi_FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873 |
| container_end_page | 1989 |
| container_issue | 9-11 |
| container_start_page | 1985 |
| container_title | Microelectronics and reliability |
| container_volume | 51 |
| creator | Vacher, F. Calvet, B. Mialhe, F. |
| description | ► Description of the power cycling constraint in space application. ► Power cycling experiment on space transistors characterized by small power and high reliability. ► Influence of thermal excursion and current on the number of cycles to failure. ► Applicability of standard traction power cycling analysis to space transistors. ► Lifetime prediction for a typical space application.
This paper presents a complete study about power cycling stress on space components. Power cycling fatigue is generally studied for traction or automotive applications. But power cycling failures are also a major cause of concern in space industry. In this paper we successively address the following subjects: definition of the power cycling stress in space applications, experimental power cycling test on space components and lifetime prediction for a typical earth observation application. |
| doi_str_mv | 10.1016/j.microrel.2011.06.013 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_926323358</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0026271411002125</els_id><sourcerecordid>926323358</sourcerecordid><originalsourceid>FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873</originalsourceid><addsrcrecordid>eNqFkMFO3DAQhi3USt1SXqHypeKUdBw7TnIDobZUQmoPReJm2ZMx8sqbpHYWxNvjZaHXnubyf_PPfIx9FlALEPrrtt4FTHOiWDcgRA26BiFP2Eb0XVMNSty9YxuARldNJ9QH9jHnLQB0Jbth5vf8SInjE8Yw3XNv13C_J26nkcfgaQ074kuiMeAa5onPni8vAEXCNc1TQD7SQ0DKPEw8LxYLvCwxoD0A-RN7723MdPY6T9nt929_rq6rm18_fl5d3lQoO7VWo-9BDaNqB-lE72Rnle1d22LXgQOtvBukd0rB0HrnwaHTMHgtsG9H5_pOnrLz494lzX_3lFezCxkpRjvRvM9maLRspGz7ktTHZHGWcyJvlhR2Nj0ZAeYg1GzNm1BzEGpAmyK0gF9eK2xGG32yE4b8j26UFn07HE65OOao_PsQKJmMgSYsElORZsY5_K_qGeepkTc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>926323358</pqid></control><display><type>article</type><title>Power cycling fatigue and lifetime prediction of power electronic devices in space applications</title><source>ScienceDirect Freedom Collection</source><creator>Vacher, F. ; Calvet, B. ; Mialhe, F.</creator><creatorcontrib>Vacher, F. ; Calvet, B. ; Mialhe, F.</creatorcontrib><description>► Description of the power cycling constraint in space application. ► Power cycling experiment on space transistors characterized by small power and high reliability. ► Influence of thermal excursion and current on the number of cycles to failure. ► Applicability of standard traction power cycling analysis to space transistors. ► Lifetime prediction for a typical space application.
This paper presents a complete study about power cycling stress on space components. Power cycling fatigue is generally studied for traction or automotive applications. But power cycling failures are also a major cause of concern in space industry. In this paper we successively address the following subjects: definition of the power cycling stress in space applications, experimental power cycling test on space components and lifetime prediction for a typical earth observation application.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2011.06.013</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Applied sciences ; Automotive components ; Automotive industry ; Cycles ; Electrical engineering. Electrical power engineering ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Fatigue (materials) ; Fatigue failure ; Power electronics, power supplies ; Space applications ; Stresses ; Traction</subject><ispartof>Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1985-1989</ispartof><rights>2011 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873</citedby><cites>FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=24618597$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Vacher, F.</creatorcontrib><creatorcontrib>Calvet, B.</creatorcontrib><creatorcontrib>Mialhe, F.</creatorcontrib><title>Power cycling fatigue and lifetime prediction of power electronic devices in space applications</title><title>Microelectronics and reliability</title><description>► Description of the power cycling constraint in space application. ► Power cycling experiment on space transistors characterized by small power and high reliability. ► Influence of thermal excursion and current on the number of cycles to failure. ► Applicability of standard traction power cycling analysis to space transistors. ► Lifetime prediction for a typical space application.
This paper presents a complete study about power cycling stress on space components. Power cycling fatigue is generally studied for traction or automotive applications. But power cycling failures are also a major cause of concern in space industry. In this paper we successively address the following subjects: definition of the power cycling stress in space applications, experimental power cycling test on space components and lifetime prediction for a typical earth observation application.</description><subject>Applied sciences</subject><subject>Automotive components</subject><subject>Automotive industry</subject><subject>Cycles</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fatigue (materials)</subject><subject>Fatigue failure</subject><subject>Power electronics, power supplies</subject><subject>Space applications</subject><subject>Stresses</subject><subject>Traction</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqFkMFO3DAQhi3USt1SXqHypeKUdBw7TnIDobZUQmoPReJm2ZMx8sqbpHYWxNvjZaHXnubyf_PPfIx9FlALEPrrtt4FTHOiWDcgRA26BiFP2Eb0XVMNSty9YxuARldNJ9QH9jHnLQB0Jbth5vf8SInjE8Yw3XNv13C_J26nkcfgaQ074kuiMeAa5onPni8vAEXCNc1TQD7SQ0DKPEw8LxYLvCwxoD0A-RN7723MdPY6T9nt929_rq6rm18_fl5d3lQoO7VWo-9BDaNqB-lE72Rnle1d22LXgQOtvBukd0rB0HrnwaHTMHgtsG9H5_pOnrLz494lzX_3lFezCxkpRjvRvM9maLRspGz7ktTHZHGWcyJvlhR2Nj0ZAeYg1GzNm1BzEGpAmyK0gF9eK2xGG32yE4b8j26UFn07HE65OOao_PsQKJmMgSYsElORZsY5_K_qGeepkTc</recordid><startdate>20110901</startdate><enddate>20110901</enddate><creator>Vacher, F.</creator><creator>Calvet, B.</creator><creator>Mialhe, F.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20110901</creationdate><title>Power cycling fatigue and lifetime prediction of power electronic devices in space applications</title><author>Vacher, F. ; Calvet, B. ; Mialhe, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Applied sciences</topic><topic>Automotive components</topic><topic>Automotive industry</topic><topic>Cycles</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fatigue (materials)</topic><topic>Fatigue failure</topic><topic>Power electronics, power supplies</topic><topic>Space applications</topic><topic>Stresses</topic><topic>Traction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vacher, F.</creatorcontrib><creatorcontrib>Calvet, B.</creatorcontrib><creatorcontrib>Mialhe, F.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vacher, F.</au><au>Calvet, B.</au><au>Mialhe, F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Power cycling fatigue and lifetime prediction of power electronic devices in space applications</atitle><jtitle>Microelectronics and reliability</jtitle><date>2011-09-01</date><risdate>2011</risdate><volume>51</volume><issue>9-11</issue><spage>1985</spage><epage>1989</epage><pages>1985-1989</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>► Description of the power cycling constraint in space application. ► Power cycling experiment on space transistors characterized by small power and high reliability. ► Influence of thermal excursion and current on the number of cycles to failure. ► Applicability of standard traction power cycling analysis to space transistors. ► Lifetime prediction for a typical space application.
This paper presents a complete study about power cycling stress on space components. Power cycling fatigue is generally studied for traction or automotive applications. But power cycling failures are also a major cause of concern in space industry. In this paper we successively address the following subjects: definition of the power cycling stress in space applications, experimental power cycling test on space components and lifetime prediction for a typical earth observation application.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2011.06.013</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 0026-2714 |
| ispartof | Microelectronics and reliability, 2011-09, Vol.51 (9-11), p.1985-1989 |
| issn | 0026-2714 1872-941X |
| language | eng |
| recordid | cdi_proquest_miscellaneous_926323358 |
| source | ScienceDirect Freedom Collection |
| subjects | Applied sciences Automotive components Automotive industry Cycles Electrical engineering. Electrical power engineering Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Fatigue (materials) Fatigue failure Power electronics, power supplies Space applications Stresses Traction |
| title | Power cycling fatigue and lifetime prediction of power electronic devices in space applications |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T16%3A49%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Power%20cycling%20fatigue%20and%20lifetime%20prediction%20of%20power%20electronic%20devices%20in%20space%20applications&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Vacher,%20F.&rft.date=2011-09-01&rft.volume=51&rft.issue=9-11&rft.spage=1985&rft.epage=1989&rft.pages=1985-1989&rft.issn=0026-2714&rft.eissn=1872-941X&rft.coden=MCRLAS&rft_id=info:doi/10.1016/j.microrel.2011.06.013&rft_dat=%3Cproquest_cross%3E926323358%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c374t-df8049d4593b18b37a4a8b55c770b064fb93fb44095fbf0bcb609f61c85dbb873%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=926323358&rft_id=info:pmid/&rfr_iscdi=true |