Atomic force microscopy and X-ray photoelectron spectroscopy study of chitosan-carbon fiber materials

Chitosan-carbon materials produced by electrochemical deposition of chitosan on an activated carbon fiber (ACF) as an electrode have been studied by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). AFM data demonstrate that the microstructure of the coating depends on whethe...

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Bibliographic Details
Published in:Inorganic materials 2010-03, Vol.46 (3), p.221-225
Main Authors: Nikolenko, Yu. M., Kuryavyi, V. G., Sheveleva, I. V., Zemskova, L. A., Sergienko, V. I.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Chemistry
Chemistry and Materials Science
Chitosan
Deposition
Electrodes
Fibers
Industrial Chemistry/Chemical Engineering
Inorganic Chemistry
Materials Science
Photoelectron spectroscopy
X-ray photoelectron spectroscopy
X-rays
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Summary:Chitosan-carbon materials produced by electrochemical deposition of chitosan on an activated carbon fiber (ACF) as an electrode have been studied by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). AFM data demonstrate that the microstructure of the coating depends on whether chitosan is deposited in soluble or insoluble form. XPS data are used to evaluate the state of chitosan in the composites in relation to the deposition conditions.
ISSN:0020-1685
1608-3172
DOI:10.1134/S0020168510030027