Co-sputtered SiC + Ag nanomixtures as visible wavelength negative index metamaterials

The fabrication and characterization of a novel metamaterial that shows negative index in the visible (blue) is reported. The real part of the negative index of this metamaterial at 405 nm, comprising co-sputtered SiC + Ag nanoparticle mixture on a glass substrate, is deduced from results of double...

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Bibliographic Details
Published in:Optics express 2012-03, Vol.20 (7), p.7095-7100
Main Authors: Nehmetallah, G, Aylo, R, Powers, P, Sarangan, A, Gao, J, Li, H, Achari, A, Banerjee, P P
Format: Article
Language:English
Subjects:
Carbon Compounds, Inorganic - chemistry
Cobalt - chemistry
Complex Mixtures - chemistry
Light
Manufactured Materials
Materials Testing
Nanoparticles - chemistry
Refractometry - instrumentation
Scattering, Radiation
Silicon Compounds - chemistry
Silver - chemistry
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Summary:The fabrication and characterization of a novel metamaterial that shows negative index in the visible (blue) is reported. The real part of the negative index of this metamaterial at 405 nm, comprising co-sputtered SiC + Ag nanoparticle mixture on a glass substrate, is deduced from results of double Michelson interferometry setup which shows a negative phase delay. It is numerically verified that this metamaterial can yield near-field super-resolution imaging for both TE and TM polarizations.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.20.007095